Electrochemically induced iodine migration in mixed halide perovskites: suppression through chloride insertion

Cho, Junsang; DuBose, Jeffrey T.; Mathew, Preethi S.; Kamat, Prashant V.

doi:10.1039/d0cc06217k

Electrochemically induced iodine migration in mixed halide perovskites: suppression through chloride insertion

Journal Article · Mon Nov 23 00:00:00 EST 2020 · ChemComm

DOI:https://doi.org/10.1039/d0cc06217k· OSTI ID:1830795

Cho, Junsang ^[1]; ^[2]; Mathew, Preethi S. ^[2]; ^[2]

Univ. of Notre Dame, IN (United States); Univ of Notre Dame
Univ. of Notre Dame, IN (United States)

The role of chloride in improving the stability of mixed halide perovskites (MAPbCl_xBr_0.5_(1–x)I_0.5(1–x))₃ is probed using spectroelectrochemistry. Here, the injection of holes into mixed halide perovskite films through applied anodic bias results in the selective migration of iodine with ultimate expulsion into the electrolyte. Increasing the Cl content (x = 0 to 0.1) in the mixed halide perovskite suppresses the iodine mobility and thus decreases the rate of its expulsion into the solution. Implications of iodine mobility induced by hole accumulation and its impact on overall stability is discussed.

View Accepted Manuscript (DOE)

Research Organization:: Univ. of Notre Dame, IN (United States)

Sponsoring Organization:: USDOE Office of Science (SC), Basic Energy Sciences (BES); USDOE Office of Science (SC), Basic Energy Sciences (BES). Chemical Sciences, Geosciences & Biosciences Division

Grant/Contract Number:: FC02-04ER15533; SC0014334

OSTI ID:: 1830795

Alternate ID(s):: OSTI ID: 1735388
OSTI ID: 1909220

Journal Information:: ChemComm, Journal Name: ChemComm Journal Issue: 2 Vol. 57; ISSN 1359-7345

Publisher:: Royal Society of ChemistryCopyright Statement

Country of Publication:: United States

Language:: English

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