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Moiré metrology of energy landscapes in van der Waals heterostructures

Journal Article · · Nature Communications
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  1. Columbia Univ., New York, NY (United States). Dept. of Physics; OSTI
  2. Columbia Univ., New York, NY (United States). Dept. of Mechanical Engineering
  3. Columbia Univ., New York, NY (United States). Dept. of Physics
  4. Max Planck Inst. for the Structure and Dynamics of Matter, Hamburg (Germany). Center Free-Electron Laser Science
  5. Harvard Univ., Cambridge, MA (United States). Dept. of Physics
  6. National Inst. for Material Science, Tsukuba (Japan)
  7. Harvard Univ., Cambridge, MA (United States). John A. Paulson School of Engineering and Applied Sciences
  8. Max Planck Inst. for the Structure and Dynamics of Matter, Hamburg (Germany). Center Free-Electron Laser Science; RWTH Aachen Univ. (Germany). Institut fur Theorie der Statistischen Physik
  9. Max Planck Inst. for the Structure and Dynamics of Matter, Hamburg (Germany). Center Free-Electron Laser Science; Flatiron Institute, New York, NY (United States). Center for Computational Quantum Physics
The emerging field of twistronics, which harnesses the twist angle between two-dimensional materials, represents a promising route for the design of quantum materials, as the twist-angle-induced superlattices offer means to control topology and strong correlations. At the small twist limit, and particularly under strain, as atomic relaxation prevails, the emergent moiré superlattice encodes elusive insights into the local interlayer interaction. Here we introduce moiré metrology as a combined experiment-theory framework to probe the stacking energy landscape of bilayer structures at the 0.1 meV/atom scale, outperforming the gold-standard of quantum chemistry. Through studying the shapes of moiré domains with numerous nano-imaging techniques, and correlating with multi-scale modelling, we assess and refine first-principle models for the interlayer interaction. We document the prowess of moiré metrology for three representative twisted systems: bilayer graphene, double bilayer graphene and H-stacked MoSe2/WSe2. Moiré metrology establishes sought after experimental benchmarks for interlayer interaction, thus enabling accurate modelling of twisted multilayers.
Research Organization:
Columbia Univ., New York, NY (United States); Krell Institute, Ames, IA (United States)
Sponsoring Organization:
USDOE Office of Science (SC), Basic Energy Sciences (BES)
Grant/Contract Number:
NA0003864; SC0019443
OSTI ID:
1816209
Journal Information:
Nature Communications, Journal Name: Nature Communications Journal Issue: 1 Vol. 12; ISSN 2041-1723
Publisher:
Nature Publishing GroupCopyright Statement
Country of Publication:
United States
Language:
English

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