FPGA Reliability Test Design Using Parametric Degradation Analysis.
Conference
·
OSTI ID:1812458
Abstract not provided.
- Research Organization:
- Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
- Sponsoring Organization:
- USDOE National Nuclear Security Administration (NNSA)
- DOE Contract Number:
- DE-NA0003525
- OSTI ID:
- 1812458
- Report Number(s):
- SAND2020-7974PE; 687824
- Resource Relation:
- Conference: Proposed for presentation at the MARTIANS Summer Project Presentations held July 22, 2020.
- Country of Publication:
- United States
- Language:
- English
Similar Records
The Use of Degradation Measures to Design Reliability Test Plans.
Multi-Objective Parametric Analysis of EV Traction Inverter between Reliability and Effciency.
Linear Covariance Analysis Framework for Aerospace Vehicle Trajectory Modeling and Parametric Design.
Conference
·
Wed Jan 01 00:00:00 EST 2014
·
OSTI ID:1812458
Multi-Objective Parametric Analysis of EV Traction Inverter between Reliability and Effciency.
Conference
·
Thu Dec 01 00:00:00 EST 2022
·
OSTI ID:1812458
+2 more
Linear Covariance Analysis Framework for Aerospace Vehicle Trajectory Modeling and Parametric Design.
Conference
·
Sat Jan 01 00:00:00 EST 2022
·
OSTI ID:1812458
+2 more