Optical Characterization of Defects in High-efficiency (Ag,Cu)(In,Ga)Se2
Conference
·
· 2020 47th IEEE Photovoltaic Specialists Conference (PVSC)
- The Department of Electrical and Computer Engineering, The Ohio State University, Columbus, Ohio 43210 USA
We applied time-resolved photoluminescence (TRPL) spectroscopy to study optimized chalcopyrite (Ag,Cu)(In,Ga)Se 2 thin films. The device shows power conversion efficiency of 18.7%. The metastable defect V Se -V Cu within ACIGS at Ev+0.98 eV is detected in sub-bandgap TRPL excitation spectra. TRPL lifetime of 50 ns is limited by the density of mid-gap defects such as Cu Ga or Cu In . The similarity of TRPL dynamics before and after light soaking indicates the optimized ACIGS thin film is less metastable because the density of V Cu -V Se defect is reduced to below 10 15 cm -3 . This study indicates that ACIGS has improved cell efficiency and reliability characteristics.
- Research Organization:
- The Ohio State University, National Renewable Energy Laboratory, Colorado School of Mines
- Sponsoring Organization:
- USDOE Office of Energy Efficiency and Renewable Energy (EERE), Renewable Power Office. Solar Energy Technologies Office
- DOE Contract Number:
- EE0008755
- OSTI ID:
- 1808843
- Journal Information:
- 2020 47th IEEE Photovoltaic Specialists Conference (PVSC), Journal Name: 2020 47th IEEE Photovoltaic Specialists Conference (PVSC)
- Country of Publication:
- United States
- Language:
- English
Similar Records
Optical Characterization of Defects in High-Efficiency (Ag,Cu)(In,Ga)Se2
Optical Spectroscopic Probes of Degradation and Metastability in Polycrystalline (Ag,Cu)(In,Ga)Se2 Absorbers
Conference
·
Mon Jan 04 23:00:00 EST 2021
·
OSTI ID:1765617
Optical Spectroscopic Probes of Degradation and Metastability in Polycrystalline (Ag,Cu)(In,Ga)Se2 Absorbers
Conference
·
Wed Nov 28 23:00:00 EST 2018
·
OSTI ID:1507657