Comparison of High and Low Flux He Exposures on the Gain Degradation and Defect Spectra in Si pnp BJTs.

Conference · Sun Apr 01 00:00:00 EDT 2018

OSTI ID:1806975

Aguirre, Brandon Adrian; Vaandrager, Bastiaan Leendert; Vizkelethy, Gyorgy; Martin, William Joseph; Seidl, P.; Persaud, A.; Ji, Q.; Ludewigt, B. A.; Schenkel, T.; Bielejec, Edward S.

Abstract not provided.

• Research Organization: Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)
• Sponsoring Organization: USDOE National Nuclear Security Administration (NNSA)
• DOE Contract Number: AC04-94AL85000
• OSTI ID: 1806975
• Report Number(s): SAND2018-3775C; 670129
• Country of Publication: United States
• Language: English