Methods for aligning a spectrometer

Patent · Tue Mar 30 04:00:00 EDT 2021

OSTI ID:1805678

Mortensen, Devon R.; Seidler, Gerald Todd

An example method for aligning a spectrometer is described herein. The spectrometer includes a radiation source, a crystal analyzer, and a detector that are all positioned on an instrument plane. The method includes rotating the crystal analyzer about an axis that is within the instrument plane and perpendicular to a rotation plane such that (i) a reciprocal lattice vector of the crystal analyzer is within the instrument plane or (ii) a component of the reciprocal lattice vector within the rotation plane is perpendicular to the instrument plane. An origin of the reciprocal lattice vector is located on the axis. The method further includes tilting the crystal analyzer or translating the detector such that the reciprocal lattice vector bisects a line segment that is bounded by the detector and the radiation source. Example spectrometers related to the example method are also disclosed.

• Research Organization: Univ. of Washington, Seattle, WA (United States)
• Sponsoring Organization: USDOE
• DOE Contract Number: SC0002194; SC0008580
• Assignee: University of Washington (Seattle, WA)
• Patent Number(s): 10,962,490
• Application Number: 16/066,500
• OSTI ID: 1805678
• Country of Publication: United States
• Language: English