py4DSTEM: A Software Package for Four-Dimensional Scanning Transmission Electron Microscopy Data Analysis

Savitzky, Benjamin H.; Zeltmann, Steven E.; Hughes, Lauren A.; Brown, Hamish G.; Zhao, Shiteng; Pelz, Philipp M.; Pekin, Thomas C.; Barnard, Edward S.; Donohue, Jennifer; DaCosta, Luis Rangel; Kennedy, Ellis; Xie, Yujun; Janish, Matthew T.; Schneider, Matthew M.; Herring, Patrick; Gopal, Chirranjeevi; Anapolsky, Abraham; Dhall, Rohan; Bustillo, Karen C.; Ercius, Peter; Scott, Mary C.; Ciston, Jim; Minor, Andrew M.; Ophus, Colin

doi:10.1017/s1431927621000477

Title: py4DSTEM: A Software Package for Four-Dimensional Scanning Transmission Electron Microscopy Data Analysis

Journal Article · Fri May 21 00:00:00 EDT 2021 · Microscopy and Microanalysis

DOI:https://doi.org/10.1017/s1431927621000477· OSTI ID:1798795

^[1]; Zeltmann, Steven E. ^[2]; Hughes, Lauren A. ^[1];

^[1]; Zhao, Shiteng ^[3]; Pelz, Philipp M. ^[3]; Pekin, Thomas C. ^[4]; Barnard, Edward S. ^[1]; Donohue, Jennifer ^[3];

^[5]; Kennedy, Ellis ^[3]; Xie, Yujun ^[1]; Janish, Matthew T. ^[6]; Schneider, Matthew M. ^[6]; Herring, Patrick ^[7]; Gopal, Chirranjeevi ^[7]; Anapolsky, Abraham ^[7]; Dhall, Rohan ^[1]; Bustillo, Karen C. ^[1]; Ercius, Peter ^[1] more »

Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States)
Univ. of California, Berkeley, CA (United States)
Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States); Univ. of California, Berkeley, CA (United States)
Humboldt-Univ. zu Berlin (Germany)
Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States); Univ. of Michigan, Ann Arbor, MI (United States)
Los Alamos National Lab. (LANL), Los Alamos, NM (United States)
Toyota Research Inst., Los Altos, CA (United States)

Scanning transmission electron microscopy (STEM) allows for imaging, diffraction, and spectroscopy of materials on length scales ranging from microns to atoms. By using a high-speed, direct electron detector, it is now possible to record a full two-dimensional (2D) image of the diffracted electron beam at each probe position, typically a 2D grid of probe positions. These 4D-STEM datasets are rich in information, including signatures of the local structure, orientation, deformation, electromagnetic fields, and other sample-dependent properties. However, extracting this information requires complex analysis pipelines that include data wrangling, calibration, analysis, and visualization, all while maintaining robustness against imaging distortions and artifacts. In this paper, we present py4DSTEM, an analysis toolkit for measuring material properties from 4D-STEM datasets, written in the Python language and released with an open-source license. We describe the algorithmic steps for dataset calibration and various 4D-STEM property measurements in detail and present results from several experimental datasets. We also implement a simple and universal file format appropriate for electron microscopy data in py4DSTEM, which uses the open-source HDF5 standard. We hope this tool will benefit the research community and help improve the standards for data and computational methods in electron microscopy, and we invite the community to contribute to this ongoing project.

View Accepted Manuscript (DOE)

Cite

Export

Save

Research Organization:: Lawrence Berkeley National Laboratory (LBNL), Berkeley, CA (United States)

Sponsoring Organization:: USDOE Office of Science (SC), Basic Energy Sciences (BES). Scientific User Facilities Division; National Science Foundation (NSF); US Department of the Navy, Office of Naval Research (ONR); USDOE Office of Science (SC), Basic Energy Sciences (BES). Materials Sciences & Engineering Division; USDOE National Nuclear Security Administration (NNSA)

Grant/Contract Number:: AC02-05CH11231; DMR 1548924; N00014-17-1-228; KC22ZH; 89233218CNA000001

OSTI ID:: 1798795

Alternate ID(s):: OSTI ID: 1894621

Journal Information:: Microscopy and Microanalysis, Vol. 27, Issue 4; ISSN 1431-9276

Publisher:: Microscopy Society of America (MSA)Copyright Statement

Country of Publication:: United States

Language:: English

References (95)

Correcting nonlinear drift distortion of scanning probe and scanning transmission electron microscopies from image pairs with orthogonal scan directions Ophus, Colin; Ciston, Jim; Nelson, Chris T. Ultramicroscopy, Vol. 162 https://doi.org/10.1016/j.ultramic.2015.12.002	journal	March 2016
Simulating high-angle annular dark-field stem images including inelastic thermal diffuse scattering Wang, Z. L.; Cowley, J. M. Ultramicroscopy, Vol. 31, Issue 4 https://doi.org/10.1016/0304-3991(89)90340-9	journal	December 1989
Revolving scanning transmission electron microscopy: Correcting sample drift distortion without prior knowledge Sang, Xiahan; LeBeau, James M. Ultramicroscopy, Vol. 138 https://doi.org/10.1016/j.ultramic.2013.12.004	journal	March 2014
Atomic-scale quantification of charge densities in two-dimensional materials Müller-Caspary, Knut; Duchamp, Martial; Rösner, Malte Physical Review B, Vol. 98, Issue 12 https://doi.org/10.1103/PhysRevB.98.121408	journal	September 2018
Image registration of low signal-to-noise cryo-STEM data Savitzky, Benjamin H.; El Baggari, Ismail; Clement, Colin B. Ultramicroscopy, Vol. 191 https://doi.org/10.1016/j.ultramic.2018.04.008	journal	August 2018
USID and Pycroscopy – Open Source Frameworks for Storing and Analyzing Imaging and Spectroscopy Data Somnath, Suhas; Smith, Chris R.; Laanait, Nouamane Microscopy and Microanalysis, Vol. 25, Issue S2 https://doi.org/10.1017/S1431927619001831	journal	August 2019
Local, atomic-level elastic strain measurements of metallic glass thin films by electron diffraction Ebner, C.; Sarkar, R.; Rajagopalan, J. Ultramicroscopy, Vol. 165 https://doi.org/10.1016/j.ultramic.2016.04.004	journal	June 2016
A high-speed area detector for novel imaging techniques in a scanning transmission electron microscope Caswell, T. A.; Ercius, P.; Tate, M. W. Ultramicroscopy, Vol. 109, Issue 4 https://doi.org/10.1016/j.ultramic.2008.11.023	journal	March 2009
Efficient subpixel image registration algorithms Guizar-Sicairos, Manuel; Thurman, Samuel T.; Fienup, James R. Optics Letters, Vol. 33, Issue 2 https://doi.org/10.1364/OL.33.000156	journal	January 2008
Single Atom Detection from Low Contrast-to-Noise Ratio Electron Microscopy Images Fatermans, J.; den Dekker, A. J.; Müller-Caspary, K. Physical Review Letters, Vol. 121, Issue 5 https://doi.org/10.1103/PhysRevLett.121.056101	journal	July 2018
Atomic Resolution Defocused Electron Ptychography at Low Dose with a Fast, Direct Electron Detector Song, Jiamei; Allen, Christopher S.; Gao, Si Scientific Reports, Vol. 9, Issue 1 https://doi.org/10.1038/s41598-019-40413-z	journal	March 2019
Polycrystal orientation maps from TEM Fundenberger, J. -J.; Morawiec, A.; Bouzy, E. Ultramicroscopy, Vol. 96, Issue 2 https://doi.org/10.1016/S0304-3991(02)00435-7	journal	August 2003
Evaluation of two-dimensional strain distribution by STEM/NBD Uesugi, Fumihiko; Hokazono, Akira; Takeno, Shiro Ultramicroscopy, Vol. 111, Issue 8 https://doi.org/10.1016/j.ultramic.2011.01.035	journal	July 2011
Variable Coherence Microscopy: a Rich Source of Structural Information from Disordered Materials Treacy, M. M. J.; Gibson, J. M. Acta Crystallographica Section A Foundations of Crystallography, Vol. 52, Issue 2 https://doi.org/10.1107/S0108767395012876	journal	March 1996
Dynamische Theorie der Kristallstrukturanalyse durch Elektronenbeugung im inhomogenen Primärstrahlwellenfeld Hegerl, R.; Hoppe, W. Berichte der Bunsengesellschaft für physikalische Chemie, Vol. 74, Issue 11 https://doi.org/10.1002/bbpc.19700741112	journal	November 1970
Development of Diffraction Imaging for Orientation Analysis of Grains in Scanning Transmission Electron Microscopy Watanabe, M.; Williams, D. Microscopy and Microanalysis, Vol. 13, Issue S02 https://doi.org/10.1017/S1431927607075204	journal	August 2007
Linear-scaling algorithm for rapid computation of inelastic transitions in the presence of multiple electron scattering Brown, Hamish G.; Ciston, Jim; Ophus, Colin Physical Review Research, Vol. 1, Issue 3 https://doi.org/10.1103/PhysRevResearch.1.033186	journal	December 2019
Practical aspects of diffractive imaging using an atomic-scale coherent electron probe Chen, Z.; Weyland, M.; Ercius, P. Ultramicroscopy, Vol. 169 https://doi.org/10.1016/j.ultramic.2016.06.009	journal	October 2016
Underneath the Bragg Peaks Egami, T.; Billinge, S. J. L. Materials Today, Vol. 6, Issue 6 https://doi.org/10.1016/S1369-7021(03)00635-7	journal	June 2003
Patterned probes for high precision 4D-STEM bragg measurements Zeltmann, Steven E.; Müller, Alexander; Bustillo, Karen C. Ultramicroscopy, Vol. 209 https://doi.org/10.1016/j.ultramic.2019.112890	journal	February 2020
A streaming multi-GPU implementation of image simulation algorithms for scanning transmission electron microscopy Pryor, Alan; Ophus, Colin; Miao, Jianwei Advanced Structural and Chemical Imaging, Vol. 3, Issue 1 https://doi.org/10.1186/s40679-017-0048-z	journal	October 2017
Computationally Mediated Experimental Science Zaluzec, Nestor J. Microscopy and Microanalysis, Vol. 9, Issue S02 https://doi.org/10.1017/S1431927603440427	journal	August 2003
Using STEM with quasi-parallel illumination and an automated peak-finding routine for strain analysis at the nanometre scale Sourty, E.; Stanley, J.; Freitag, B. 2009 16th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) https://doi.org/10.1109/IPFA.2009.5232604	conference	July 2009
Vortex beam production and contrast enhancement from a magnetic spiral phase plate Blackburn, A. M.; Loudon, J. C. Ultramicroscopy, Vol. 136 https://doi.org/10.1016/j.ultramic.2013.08.009	journal	January 2014
Differential phase-contrast microscopy at atomic resolution Shibata, Naoya; Findlay, Scott D.; Kohno, Yuji Nature Physics, Vol. 8, Issue 8 https://doi.org/10.1038/nphys2337	journal	June 2012
Experimental tests on double-resolution coherent imaging via STEM Rodenburg, J. M.; McCallum, B. C.; Nellist, P. D. Ultramicroscopy, Vol. 48, Issue 3 https://doi.org/10.1016/0304-3991(93)90105-7	journal	March 1993
Towards quantitative, atomic-resolution reconstruction of the electrostatic potential via differential phase contrast using electrons Close, R.; Chen, Z.; Shibata, N. Ultramicroscopy, Vol. 159 https://doi.org/10.1016/j.ultramic.2015.09.002	journal	December 2015
Direct observation of Σ7 domain boundary core structure in magnetic skyrmion lattice Matsumoto, Takao; So, Yeong-Gi; Kohno, Yuji Science Advances, Vol. 2, Issue 2 https://doi.org/10.1126/sciadv.1501280	journal	February 2016
Design considerations and performance of an analytical stem Craven, A. J.; Buggy, T. W. Ultramicroscopy, Vol. 7, Issue 1 https://doi.org/10.1016/0304-3991(81)90020-6	journal	January 1981
Automated nanocrystal orientation and phase mapping in the transmission electron microscope on the basis of precession electron diffraction Rauch, Edgar F.; Portillo, Joaquin; Nicolopoulos, Stavros Zeitschrift für Kristallographie, Vol. 225, Issue 2-3 https://doi.org/10.1524/zkri.2010.1205	journal	January 2010
Electroplating lithium transition metal oxides Zhang, Huigang; Ning, Hailong; Busbee, John Science Advances, Vol. 3, Issue 5 https://doi.org/10.1126/sciadv.1602427	journal	May 2017
Linear phase imaging using differential interference contrast microscopy Arnison, M. R.; Larkin, K. G.; Sheppard, C. J. R. Journal of Microscopy, Vol. 214, Issue 1 https://doi.org/10.1111/j.0022-2720.2004.01293.x	journal	April 2004
The theory of super-resolution electron microscopy via Wigner-distribution deconvolution Rodenburg, J. M.; Bates, R. H. T. Philosophical Transactions of the Royal Society of London. Series A: Physical and Engineering Sciences, Vol. 339, Issue 1655, p. 521-553 https://doi.org/10.1098/rsta.1992.0050	journal	June 1992
Metal-organic framework crystal-glass composites Hou, Jingwei; Ashling, Christopher W.; Collins, Sean M. Nature Communications, Vol. 10, Issue 1 https://doi.org/10.1038/s41467-019-10470-z	journal	June 2019
(Invited) Nano-Beam Diffraction: Crystal Structure and Strain Analysis at the Nanoscale Favia, Paola; Popovici, Mihaela; Eneman, G. ECS Transactions, Vol. 33, Issue 11 https://doi.org/10.1149/1.3485694	journal	October 2010
Measuring nanometre-scale electric fields in scanning transmission electron microscopy using segmented detectors Brown, H. G.; Shibata, N.; Sasaki, H. Ultramicroscopy, Vol. 182 https://doi.org/10.1016/j.ultramic.2017.07.002	journal	November 2017
Realistic models of paracrystalline silicon Nakhmanson, S. M.; Voyles, P. M.; Mousseau, Normand Physical Review B, Vol. 63, Issue 23, Article No. 235207 https://doi.org/10.1103/PhysRevB.63.235207	journal	May 2001
Influence of distortions of recorded diffraction patterns on strain analysis by nano-beam electron diffraction Mahr, Christoph; Müller-Caspary, Knut; Ritz, Robert Ultramicroscopy, Vol. 196 https://doi.org/10.1016/j.ultramic.2018.09.010	journal	January 2019
Optimizing disk registration algorithms for nanobeam electron diffraction strain mapping Pekin, Thomas C.; Gammer, Christoph; Ciston, Jim Ultramicroscopy, Vol. 176 https://doi.org/10.1016/j.ultramic.2016.12.021	journal	May 2017
Phase contrast STEM for thin samples: Integrated differential phase contrast Lazić, Ivan; Bosch, Eric G. T.; Lazar, Sorin Ultramicroscopy, Vol. 160 https://doi.org/10.1016/j.ultramic.2015.10.011	journal	January 2016
Efficient linear phase contrast in scanning transmission electron microscopy with matched illumination and detector interferometry Ophus, Colin; Ciston, Jim; Pierce, Jordan Nature Communications, Vol. 7, Issue 1 https://doi.org/10.1038/ncomms10719	journal	February 2016
Radial distribution function and structural relaxation in amorphous solids Srolovitz, D.; Egami, T.; Vitek, V. Physical Review B, Vol. 24, Issue 12 https://doi.org/10.1103/PhysRevB.24.6936	journal	December 1981
A fast image simulation algorithm for scanning transmission electron microscopy Ophus, Colin Advanced Structural and Chemical Imaging, Vol. 3, Issue 1 https://doi.org/10.1186/s40679-017-0046-1	journal	May 2017
Nanoscale mosaicity revealed in peptide microcrystals by scanning electron nanodiffraction Gallagher-Jones, Marcus; Ophus, Colin; Bustillo, Karen C. Communications Biology, Vol. 2, Issue 1 https://doi.org/10.1038/s42003-018-0263-8	journal	January 2019
Combination of in situ straining and ACOM TEM: A novel method for analysis of plastic deformation of nanocrystalline metals Kobler, A.; Kashiwar, A.; Hahn, H. Ultramicroscopy, Vol. 128, p. 68-81 https://doi.org/10.1016/j.ultramic.2012.12.019	journal	May 2013
Fluctuation microscopy in the STEM Voyles, P. M.; Muller, D. A. Ultramicroscopy, Vol. 93, Issue 2 https://doi.org/10.1016/S0304-3991(02)00155-9	journal	November 2002
Electron Vortex Beams with High Quanta of Orbital Angular Momentum McMorran, B. J.; Agrawal, A.; Anderson, I. M. Science, Vol. 331, Issue 6014, p. 192-195 https://doi.org/10.1126/science.1198804	journal	January 2011
Accurate evaluation of size and refractive index for spherical objects in quantitative phase imaging Müller, Paul; Schürmann, Mirjam; Girardo, Salvatore Optics Express, Vol. 26, Issue 8 https://doi.org/10.1364/OE.26.010729	journal	January 2018
Confirmation of the Domino-Cascade Model by LiFePO ₄ /FePO ₄ Precession Electron Diffraction Brunetti, G.; Robert, D.; Bayle-Guillemaud, P. Chemistry of Materials, Vol. 23, Issue 20 https://doi.org/10.1021/cm201783z	journal	October 2011
Improved precision in strain measurement using nanobeam electron diffraction Béché, A.; Rouvière, J. L.; Clément, L. Applied Physics Letters, Vol. 95, Issue 12 https://doi.org/10.1063/1.3224886	journal	September 2009
Direct Imaging of Nanoscale Phase Separation in ${La}_{0.55} {Ca}_{0.45} {MnO}_{3}$ : Relationship to Colossal Magnetoresistance Tao, J.; Niebieskikwiat, D.; Varela, M. Physical Review Letters, Vol. 103, Issue 9 https://doi.org/10.1103/PhysRevLett.103.097202	journal	August 2009
Quantitative analysis of the accuracy and sensitivity of strain measurements from nanobeam electron diffraction Williamson, M. J.; van Dooren, P.; Flanagan, J. 2015 IEEE 22nd International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) https://doi.org/10.1109/IPFA.2015.7224366	conference	June 2015
Hyperspectral Imaging in TEM: New Ways of Information Extraction and Display Schaffer, B.; Gspan, C.; Grogger, W. Microscopy and Microanalysis, Vol. 14, Issue S2 https://doi.org/10.1017/S1431927608081348	journal	August 2008
Pixelated detectors and improved efficiency for magnetic imaging in STEM differential phase contrast Krajnak, Matus; McGrouther, Damien; Maneuski, Dzmitry Ultramicroscopy, Vol. 165 https://doi.org/10.1016/j.ultramic.2016.03.006	journal	June 2016
Beugung im inhomogenen Primärstrahlwellenfeld. III. Amplituden- und Phasenbestimmung bei unperiodischen Objekten Hoppe, W. Acta Crystallographica Section A, Vol. 25, Issue 4 https://doi.org/10.1107/S0567739469001069	journal	July 1969
Scanning transmission electron microscopy of thin specimens Cowley, J. M. Ultramicroscopy, Vol. 2 https://doi.org/10.1016/S0304-3991(76)90161-3	journal	January 1976
Strain analysis from nano-beam electron diffraction: Influence of specimen tilt and beam convergence Grieb, Tim; Krause, Florian F.; Schowalter, Marco Ultramicroscopy, Vol. 190 https://doi.org/10.1016/j.ultramic.2018.03.013	journal	July 2018
Demonstration of a 2 × 2 programmable phase plate for electrons Verbeeck, Jo; Béché, Armand; Müller-Caspary, Knut Ultramicroscopy, Vol. 190 https://doi.org/10.1016/j.ultramic.2018.03.017	journal	July 2018
Influence of electron dose rate on electron counting images recorded with the K2 camera Li, Xueming; Zheng, Shawn Q.; Egami, Kiyoshi Journal of Structural Biology, Vol. 184, Issue 2 https://doi.org/10.1016/j.jsb.2013.08.005	journal	November 2013
High Dynamic Range Pixel Array Detector for Scanning Transmission Electron Microscopy Tate, Mark W.; Purohit, Prafull; Chamberlain, Darol Microscopy and Microanalysis, Vol. 22, Issue 1 https://doi.org/10.1017/S1431927615015664	journal	January 2016
Correcting the linear and nonlinear distortions for atomically resolved STEM spectrum and diffraction imaging Wang, Yi; Suyolcu, Y. Eren; Salzberger, Ute Microscopy, Vol. 67, Issue suppl_1 https://doi.org/10.1093/jmicro/dfy002	journal	January 2018
The 4D Camera – An 87 kHz Frame-rate Detector for Counted 4D-STEM Experiments Ercius, Peter; Johnson, Ian; Brown, Hamish Microscopy and Microanalysis, Vol. 26, Issue S2 https://doi.org/10.1017/S1431927620019753	journal	July 2020
Topology of covalent non-crystalline solids I: Short-range order in chalcogenide alloys Phillips, J. C. Journal of Non-Crystalline Solids, Vol. 34, Issue 2 https://doi.org/10.1016/0022-3093(79)90033-4	journal	October 1979
Strain relaxation of strained-Si layers on SiGe-on-insulator (SGOI) structures after mesa isolation Usuda, Koji; Mizuno, Tomohisa; Tezuka, Tsutomu Applied Surface Science, Vol. 224, Issue 1-4 https://doi.org/10.1016/j.apsusc.2003.11.058	journal	March 2004
The scattering of electrons by atoms and crystals. I. A new theoretical approach Cowley, J. M.; Moodie, A. F. Acta Crystallographica, Vol. 10, Issue 10, p. 609-619 https://doi.org/10.1107/S0365110X57002194	journal	October 1957
Radial distribution function imaging by STEM diffraction: Phase mapping and analysis of heterogeneous nanostructured glasses Mu, Xiaoke; Wang, Di; Feng, Tao Ultramicroscopy, Vol. 168 https://doi.org/10.1016/j.ultramic.2016.05.009	journal	September 2016
Four-Dimensional Scanning Transmission Electron Microscopy (4D-STEM): From Scanning Nanodiffraction to Ptychography and Beyond Ophus, Colin Microscopy and Microanalysis, Vol. 25, Issue 3 https://doi.org/10.1017/S1431927619000497	journal	May 2019
Size analysis of nanoscale order in amorphous materials by variable-resolution fluctuation electron microscopy Bogle, Stephanie N.; Nittala, Lakshmi N.; Twesten, Ray D. Ultramicroscopy, Vol. 110, Issue 10 https://doi.org/10.1016/j.ultramic.2010.05.001	journal	September 2010
Automated Crystal Orientation Mapping (ACOM) with a Computer-Controlled TEM by Interpreting Transmission Kikuchi Patterns Schwarzer, Robert A.; Sukkau, J. Materials Science Forum, Vol. 273-275 https://doi.org/10.4028/www.scientific.net/MSF.273-275.215	journal	February 1998
RDFTools: A software tool for quantifying short-range ordering in amorphous materials Mitchell, D. R. G.; Petersen, T. C. Microscopy Research and Technique, Vol. 75, Issue 2 https://doi.org/10.1002/jemt.21038	journal	July 2011
High Resolution Radial Distribution Function of Pure Amorphous Silicon Laaziri, Khalid; Kycia, S.; Roorda, S. Physical Review Letters, Vol. 82, Issue 17 https://doi.org/10.1103/PhysRevLett.82.3460	journal	April 1999
Electron Bessel beam diffraction for precise and accurate nanoscale strain mapping Guzzinati, Giulio; Ghielens, Wannes; Mahr, Christoph Applied Physics Letters, Vol. 114, Issue 24 https://doi.org/10.1063/1.5096245	journal	June 2019
Local nanoscale strain mapping of a metallic glass during in situ testing Gammer, Christoph; Ophus, Colin; Pekin, Thomas C. Applied Physics Letters, Vol. 112, Issue 17 https://doi.org/10.1063/1.5025686	journal	April 2018
Sub-Ångstrom electric field measurements on a universal detector in a scanning transmission electron microscope Hachtel, Jordan A.; Idrobo, Juan Carlos; Chi, Miaofang Advanced Structural and Chemical Imaging, Vol. 4, Issue 1 https://doi.org/10.1186/s40679-018-0059-4	journal	August 2018
Strain characterization in SOI and strained-Si on SGOI MOSFET channel using nano-beam electron diffraction (NBD) Usuda, Koji; Numata, Toshinori; Irisawa, Toshifumi Materials Science and Engineering: B, Vol. 124-125 https://doi.org/10.1016/j.mseb.2005.08.062	journal	December 2005
Imaging of built-in electric field at a p-n junction by scanning transmission electron microscopy Shibata, Naoya; Findlay, Scott D.; Sasaki, Hirokazu Scientific Reports, Vol. 5, Issue 1 https://doi.org/10.1038/srep10040	journal	June 2015
Quantitative Measurements of Magnetic Vortices using Position Resolved Diffraction in Lorentz Stem Zaluzec, Nestor J. Microscopy and Microanalysis, Vol. 8, Issue S02 https://doi.org/10.1017/S143192760210064X	journal	August 2002
Advanced Computing in Electron Microscopy Kirkland, Earl J. https://doi.org/10.1007/978-1-4419-6533-2	book	January 2010
Simultaneous atomic-resolution electron ptychography and Z-contrast imaging of light and heavy elements in complex nanostructures Yang, H.; Rutte, R. N.; Jones, L. Nature Communications, Vol. 7, Issue 1 https://doi.org/10.1038/ncomms12532	journal	August 2016
The quickhull algorithm for convex hulls Barber, C. Bradford; Dobkin, David P.; Huhdanpaa, Hannu ACM Transactions on Mathematical Software, Vol. 22, Issue 4 https://doi.org/10.1145/235815.235821	journal	December 1996
Beugung im inhomogenen Primärstrahlwellenfeld. I. Prinzip einer Phasenmessung von Elektronenbeungungsinterferenzen Hoppe, W. Acta Crystallographica Section A, Vol. 25, Issue 4 https://doi.org/10.1107/S0567739469001045	journal	July 1969
Averaging of low exposure electron micrographs of non-periodic objects Frank, Joachim Ultramicroscopy, Vol. 1, Issue 2 https://doi.org/10.1016/S0304-3991(75)80020-9	journal	January 1975
Comparison of first moment STEM with conventional differential phase contrast and the dependence on electron dose Müller-Caspary, Knut; Krause, Florian F.; Winkler, Florian Ultramicroscopy, Vol. 203 https://doi.org/10.1016/j.ultramic.2018.12.018	journal	August 2019
Fast computation of Lyot-style coronagraph propagation Soummer, R.; Pueyo, L.; Sivaramakrishnan, A. Optics Express, Vol. 15, Issue 24 https://doi.org/10.1364/OE.15.015935	journal	January 2007
LiberTEM/LiberTEM: 0.4.1 Clausen, Alexander; Weber, Dieter; Ruzaeva, Karina Zenodo https://doi.org/10.5281/zenodo.3674003	software	February 2020
Simulated calibration dataset for 4D scanning transmission electron microscopy Ophus, Colin; Savitzky, Benjamin Zenodo https://doi.org/10.5281/zenodo.3592520	dataset	January 2019
Optimization of NBED simulations for disc-detection measurements Grieb, Tim; Krause, Florian F.; Mahr, Christoph Ultramicroscopy, Vol. 181 https://doi.org/10.1016/j.ultramic.2017.04.015	journal	October 2017
Generation of electron vortex beams using line charges via the electrostatic Aharonov-Bohm effect Pozzi, Giulio; Lu, Peng-Han; Tavabi, Amir H. Ultramicroscopy, Vol. 181 https://doi.org/10.1016/j.ultramic.2017.06.001	journal	October 2017
The exit-wave power-cepstrum transform for scanning nanobeam electron diffraction: robust strain mapping at subnanometer resolution and subpicometer precision Padgett, Elliot; Holtz, Megan E.; Cueva, Paul Ultramicroscopy, Vol. 214 https://doi.org/10.1016/j.ultramic.2020.112994	journal	July 2020
Strain relaxation in transistor channels with embedded epitaxial silicon germanium source/drain Liu, J. P.; Li, K.; Pandey, S. M. Applied Physics Letters, Vol. 93, Issue 22 https://doi.org/10.1063/1.3040323	journal	December 2008
Beugung in inhomogenen Primärstrahlenwellenfeld. II. Lichtoptische Analogieversuche zur Phasenmessung von Gitterinterferenzen Hoppe, W.; Strube, G. Acta Crystallographica Section A, Vol. 25, Issue 4 https://doi.org/10.1107/S0567739469001057	journal	July 1969
Diffraction contrast imaging using virtual apertures Gammer, Christoph; Burak Ozdol, V.; Liebscher, Christian H. Ultramicroscopy, Vol. 155 https://doi.org/10.1016/j.ultramic.2015.03.015	journal	August 2015
Enhanced phase contrast transfer using ptychography combined with a pre-specimen phase plate in a scanning transmission electron microscope Yang, Hao; Ercius, Peter; Nellist, Peter D. Ultramicroscopy, Vol. 171 https://doi.org/10.1016/j.ultramic.2016.09.002	journal	December 2016
The direct determination of magnetic domain wall profiles by differential phase contrast electron microscopy Chapman, J. N.; Batson, P. E.; Waddell, E. M. Ultramicroscopy, Vol. 3 https://doi.org/10.1016/S0304-3991(78)80027-8	journal	January 1978
Simulated calibration dataset for 4D scanning transmission electron microscopy Ophus, Colin; Savitzky, Benjamin Zenodo https://doi.org/10.5281/zenodo.3592519	dataset	January 2019

Similar Records

4D-STEM of Beam-Sensitive Materials

Journal Article · Wed May 12 00:00:00 EDT 2021 · Accounts of Chemical Research · OSTI ID:1798795

Bustillo, Karen C.; Zeltmann, Steven E.; Chen, Min; +4 more

Patterned probes for high precision 4D-STEM bragg measurements

Journal Article · Tue Nov 12 00:00:00 EST 2019 · Ultramicroscopy · OSTI ID:1798795

Zeltmann, Steven E.; Müller, Alexander; Bustillo, Karen C.; +4 more

Toward accurate measurement of electromagnetic field by retrieving and refining the center position of non-uniform diffraction disks in Lorentz 4D-STEM

Journal Article · Tue Apr 18 00:00:00 EDT 2023 · Ultramicroscopy · OSTI ID:1798795

Wu, Lijun; Han, Myung-Geun; Zhu, Yimei

Related Subjects

46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
calibration
diffraction
open source
STEM
4D-STEM

Title: py4DSTEM: A Software Package for Four-Dimensional Scanning Transmission Electron Microscopy Data Analysis

Citation Formats

References (95)

Similar Records

Related Subjects