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Title: Beam quality in field emitter arrays

Conference ·
OSTI ID:178208
;  [1]
  1. Univ. of Michigan, Ann Arbor, MI (United States). Dept. of Nuclear Engineering

The emerging field of vacuum microelectronics offers exciting possibilities in miniature coherent radiation sources, flat panel displays, and ultra-fast logic circuits. The crucial component is the electron emitter, which consists of an array of sharp tips from which electrons undergo field emission according to the Fowler-Nordheim (FN) relation. In this paper, the authors present a theoretical analysis of the beam emittance and of the beam brightness expected from a field emitter array. Scaling laws for these quantities are constructed that take into account of the electric field enhancement factors that accompany the sharp tips, and they are derived in a manner consistent with the FN relation. These scaling laws can immediately be used once the following parameters are given: the width and height, as well as the packing density, of the field emitter array, the anode-cathode (A-K) spacing, the A-K voltage drop, and the FN coefficients A, and B. The space-charge limited regime is explored.

OSTI ID:
178208
Report Number(s):
CONF-950612-; ISBN 0-7803-2669-5; TRN: IM9607%%238
Resource Relation:
Conference: 22. international conference on plasma science, Madison, WI (United States), 5-8 Jun 1995; Other Information: PBD: 1995; Related Information: Is Part Of IEEE conference record -- abstracts: 1995 IEEE international conference on plasma science; PB: 312 p.
Country of Publication:
United States
Language:
English

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