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Visible emission spectra of thermographic phosphors under x-ray excitation

Journal Article · · Measurement Science and Technology

Thermographic phosphors have been employed for temperature sensing in challenging environments, such as on surfaces or within solid samples exposed to dynamic heating, because of the high temporal and spatial resolution that can be achieved using this approach. Typically, UV light sources are employed to induce temperature-sensitive spectral responses from the phosphors. However, it would be beneficial to explore x-rays as an alternate excitation source to facilitate simultaneous x-ray imaging of material deformation and temperature of heated samples and to reduce UV absorption within solid samples being investigated. Here, the phosphors BaMgAl10O17:Eu (BAM), Y2SiO5:Ce, YAG:Dy, La2O2S:Eu, ZnGa2O4:Mn, Mg3F2GeO4:Mn, Gd2O2S:Tb, and ZnO were excited using incident synchrotron x-ray radiation. These materials were chosen to include conventional thermographic phosphors as well as x-ray scintillators (with crossover between these two categories). X-ray-induced thermographic behavior was explored through the measurement of visible spectral response with varying temperature. The incident x-rays were observed to excite the same electronic energy level transitions in these phosphors as UV excitation. Similar shifts in the spectral response of BAM, Y2SiO5:Ce, YAG:Dy, La2O2S:Eu, ZnGa2O4:Mn, Mg3F2GeO4:Mn, and Gd2O2S:Tb were observed when compared to their response to UV excitation found in literature. Some phosphors were observed to thermally quench in the temperature ranges tested here, while the response from others did not rise above background noise levels. This may be attributed to the increased probability of non-radiative energy release from these phosphors due to the high energy of the incident x-rays. These results indicate that x-rays can serve as a viable excitation source for phosphor thermometry.

Research Organization:
Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States); Argonne National Laboratory (ANL), Argonne, IL (United States)
Sponsoring Organization:
USDOE National Nuclear Security Administration (NNSA); USDOE Office of Science (SC); US Department of the Navy, Office of Naval Research (ONR); US Air Force Office of Scientific Research (AFOSR); National Aeronautics and Space Administration (NASA)
Grant/Contract Number:
AC04-94AL85000; AC02-06CH11357; NA0003525
OSTI ID:
1781545
Alternate ID(s):
OSTI ID: 23135938
Report Number(s):
SAND--2021-2585J; 694523
Journal Information:
Measurement Science and Technology, Journal Name: Measurement Science and Technology Journal Issue: 9 Vol. 32; ISSN 0957-0233
Publisher:
IOP PublishingCopyright Statement
Country of Publication:
United States
Language:
English

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