Development of a High-Rate Front-End ASIC for X-Ray Spectroscopy and Diffraction Applications

Journal Article · Wed Apr 01 04:00:00 EDT 2020 · IEEE Transactions on Nuclear Science

DOI:https://doi.org/10.1109/TNS.2020.2976820· OSTI ID:1774326

Vernon, Emerson; De Geronimo, Gianluigi; Baldwin, Jonathan; Chen, Wei; Fried, Jack; Giacomini, Gabriele; Kuczewski, Anthony; Kuczweski, John; Mead, Joe; Miceli, Antonino; Okasinski, John S.; Pinelli, Don; Quaranta, Orlando; Rumaiz, Abdul K.; Siddons, Peter; Smith, Graham; Stanacevic, Milutin; Woods, Russell

We developed a new front-end application-specific integrated circuit (ASIC) to upgrade the Maia X-ray microprobe. The ASIC instruments 32 configurable channels that perform either positive or negative charge amplification, pulse shaping, peak amplitude, and time extraction along with buffered analog storage. At a gain of 3.6 V/fC, 1-μs peaking time, and a temperature of 248 K, an electronic resolution of 13 and 10 e- rms was measured with and without a silicon drift detector (SDD) sensor, respectively. A spectral resolution of 170-eV full-width at half-maximum (FWHM) at 5.9 keV was obtained with an 55Fe source. The channel linearity was better than ± 1% with rate capabilities up to 40 kcps. The ASIC was fabricated in a commercial 250-nm process with a footprint of 6.3 mm × 3.9 mm and dissipates 167 mW of static power.

• Research Organization: Argonne National Laboratory (ANL)
• Sponsoring Organization: USDOE Office of Science - Office of Basic Energy Sciences - Scientific User Facilities Division
• DOE Contract Number: AC02-06CH11357
• OSTI ID: 1774326
• Journal Information: IEEE Transactions on Nuclear Science, Journal Name: IEEE Transactions on Nuclear Science Journal Issue: 4 Vol. 67; ISSN 0018-9499
• Country of Publication: United States
• Language: English