Development of a High-Rate Front-End ASIC for X-Ray Spectroscopy and Diffraction Applications

Journal Article · Mon Mar 02 00:00:00 EST 2020 · IEEE Transactions on Nuclear Science

DOI:https://doi.org/10.1109/TNS.2020.2976820· OSTI ID:1635480

Vernon, Emerson ^[1]; De Geronimo, Gianluigi ^[2]; Baldwin, Jonathan ^[3]; Chen, Wei ^[1]; Fried, Jack ^[1]; Giacomini, Gabriele ^[1]; Kuczewski, Anthony ^[4]; Kuczewski, John ^[1]; Mead, Joe ^[1]; Miceli, Antonino ^[3]; Okasinski, John S. ^[3]; Pinelli, Don ^[1]; Quaranta, Orlando ^[3]; Rumaiz, Abdul K. ^[4]; Siddons, Peter ^[4]; Smith, Graham ^[1]; Stanacevic, Milutin ^[2]; Woods, Russell ^[3]

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1. Brookhaven National Lab. (BNL), Upton, NY (United States)
2. Stony Brook Univ., NY (United States)
3. Argonne National Lab. (ANL), Argonne, IL (United States)
4. Brookhaven National Lab. (BNL), Upton, NY (United States). National Synchrotron Light Source II (NSLS-II)

We developed a new front-end application-specific integrated circuit (ASIC) to upgrade the Maia X-ray microprobe. The ASIC instruments 32 configurable channels that perform either positive or negative charge amplification, pulse shaping, peak amplitude, and time extraction along with buffered analog storage. At a gain of 3.6 V/fC, 1-μs peaking time, and a temperature of 248 K, an electronic resolution of 13 and 10 e- rms was measured with and without a silicon drift detector (SDD) sensor, respectively. A spectral resolution of 170-eV full-width at half-maximum (FWHM) at 5.9 keV was obtained with an 55Fe source. The channel linearity was better than ± 1% with rate capabilities up to 40 kcps. The ASIC was fabricated in a commercial 250-nm process with a footprint of 6.3 mm × 3.9 mm and dissipates 167 mW of static power.

• Research Organization: Brookhaven National Laboratory (BNL), Upton, NY (United States)
• Sponsoring Organization: USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22)
• Grant/Contract Number: SC0012704
• OSTI ID: 1635480
• Alternate ID(s): OSTI ID: 1774326
• Report Number(s): BNL--216102-2020-JAAM
• Journal Information: IEEE Transactions on Nuclear Science, Journal Name: IEEE Transactions on Nuclear Science Journal Issue: 4 Vol. 67; ISSN 0018-9499
• Publisher: IEEE
• Country of Publication: United States
• Language: English

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