Voxel-based strain tensors from near-field High Energy Diffraction Microscopy

Shen, Yu-Feng; Liu, He; Suter, Robert M.

doi:10.1016/j.cossms.2020.100852

Title: Voxel-based strain tensors from near-field High Energy Diffraction Microscopy

Journal Article · Sat Aug 01 00:00:00 EDT 2020 · Current Opinion in Solid State and Materials Science

DOI:https://doi.org/10.1016/j.cossms.2020.100852· OSTI ID:1769538

Shen, Yu-Feng; Liu, He; Suter, Robert M.

High energy X-ray diffraction microscopy is one of several techniques that use spatially resolved diffraction to nondestructively map crystal unit cell orientations in three dimensions inside bulk polycrystalline samples. The near-field variant of the technique (nf-HEDM) yields grain shapes, grain boundary character information, and intra-granular orientation variations. Here, we demonstrate, through analysis of simulated and physical data sets, the extension nf-HEDM to include mapping of heterogeneous intra-granular strain states with spatial resolution on the micron scale. Sensitivity to all strain tensor components is < 5 × 10**-4 . The GPU assisted implementation of an optimization algorithm is described.

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Research Organization:: Carnegie Mellon Univ., Pittsburgh, PA (United States); Argonne National Lab. (ANL), Argonne, IL (United States). Advanced Photon Source (APS)

Sponsoring Organization:: USDOE; USDOE Office of Science (SC), Basic Energy Sciences (BES). Materials Sciences & Engineering Division

Grant/Contract Number:: SC0019096; AC02-06CH11357

OSTI ID:: 1769538

Alternate ID(s):: OSTI ID: 1650350; OSTI ID: 1650353

Report Number(s):: DOE-CMU-0019096; S1359028620300504; 100852; PII: S1359028620300504

Journal Information:: Current Opinion in Solid State and Materials Science, Journal Name: Current Opinion in Solid State and Materials Science Vol. 24 Journal Issue: 4; ISSN 1359-0286

Publisher:: ElsevierCopyright Statement

Country of Publication:: United Kingdom

Language:: English

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36 MATERIALS SCIENCE
Microstructure
Metals
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nf-HEDM
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Title: Voxel-based strain tensors from near-field High Energy Diffraction Microscopy

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