Induced Current Detector Simulation
- Fermi National Accelerator Lab. (FNAL), Batavia, IL (United States)
We describe simulations of a detector concept with small, low capacitance, pixels with pitch/thickness ratio on the order of 10. The simulation utilizes 2D and 3D TCAD simulations followed by a generic SPICE front-end model including noise and Landau fluctuations. We also investigate the properties of weighting fields of various geometries. We investigate whether the transient induced current signals can be used to improve pattern recognition and establish track angle.
- Research Organization:
- Fermi National Accelerator Laboratory (FNAL), Batavia, IL (United States)
- Sponsoring Organization:
- USDOE Office of Science (SC), High Energy Physics (HEP) (SC-25)
- DOE Contract Number:
- AC02-07CH11359
- OSTI ID:
- 1769394
- Report Number(s):
- FERMILAB-FN--1118-CMS-E; oai:inspirehep.net:1848597
- Country of Publication:
- United States
- Language:
- English
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