A Numerical Study on the Impact of Cathode Catalyst Layer Loading on the Open Circuit Voltage
Journal Article
·
· Meeting abstracts (Electrochemical Society. Online)
- Univ. of Alberta, Edmonton, AB (Canada)
- Univ. of Calgary, AB (Canada)
- Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States)
- Univ. of California, Irvine, CA (United States)
The open-circuit voltage (OCV) is the measured potential when no current is drawn from a cell. Additionally, theoretically this potential is given by the equilibrium potential, which is determined from thermodynamics based on the operating conditions. In practice, the actual potential at zero current is measured to be approximately 300 mV lower than the theoretical value.
- Research Organization:
- Lawrence Berkeley National Laboratory (LBNL), Berkeley, CA (United States)
- Sponsoring Organization:
- USDOE Office of Energy Efficiency and Renewable Energy (EERE)
- Grant/Contract Number:
- AC02-05CH11231
- OSTI ID:
- 1765560
- Journal Information:
- Meeting abstracts (Electrochemical Society. Online), Journal Name: Meeting abstracts (Electrochemical Society. Online) Journal Issue: 38 Vol. MA2020-01; ISSN 2151-2043
- Publisher:
- Electrochemical SocietyCopyright Statement
- Country of Publication:
- United States
- Language:
- English
Similar Records
Change in open-circuit voltage of rechargeable cells based on silver (II) oxide and cadmium during storage in the charged state
Limits on the open-circuit voltage and efficiency of silicon solar cells imposed by intrinsic auger processes
Method for determining emitter recombination in Si solar cells using open-circuit voltage decay
Journal Article
·
Sat Jun 20 00:00:00 EDT 1992
· Russian Journal of Applied Chemistry
·
OSTI ID:159874
Limits on the open-circuit voltage and efficiency of silicon solar cells imposed by intrinsic auger processes
Journal Article
·
Tue May 01 00:00:00 EDT 1984
· IEEE Trans. Electron Devices; (United States)
·
OSTI ID:6295752
Method for determining emitter recombination in Si solar cells using open-circuit voltage decay
Journal Article
·
Wed Aug 01 00:00:00 EDT 1984
· Appl. Phys. Lett.; (United States)
·
OSTI ID:6721047