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Bayesian Approaches to Uncertainty Quantification and Structure Refinement from X-Ray Diffraction

Book ·
Research Organization:
A Research University (United States)
Sponsoring Organization:
USDOE Office of Science (SC)
OSTI ID:
1761508
Report Number(s):
APS_253118
Country of Publication:
United States
Language:
English

References (38)

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Bayesian inference of x-ray diffraction spectra from warm dense matter with the one-component-plasma model journal December 2016
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Certification of NIST Standard Reference Material 640d journal June 2010
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Bayesian Data Analysis book November 2013
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Piezoelectric Thin Films for Sensors, Actuators, and Energy Harvesting journal September 2009
A Bayesian approach to modeling diffraction profiles and application to ferroelectric materials journal February 2017
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Accounting for unknown systematic errors in Rietveld refinements: a Bayesian statistics approach journal July 2015
Effect of a crystallite size distribution on X-ray diffraction line profiles and whole-powder-pattern fitting journal June 2000
Labile Ferroelastic Nanodomains in Bilayered Ferroelectric Thin Films journal September 2009
Bayesian approach applied to the Rietveld method journal October 2014
Testing different methods for estimating uncertainties on Rietveld refined parameters using SrRietveld journal December 2011
A profile refinement method for nuclear and magnetic structures journal June 1969
Bayesian approach to powder phase identification journal April 2017
Domain texture distributions in tetragonal lead zirconate titanate by x-ray and neutron diffraction journal February 2005
The analysis of powder diffraction data journal March 1982

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