Bayesian Approaches to Uncertainty Quantification and Structure Refinement from X-Ray Diffraction

Paterson, Alisa R.; Reich, Brian J.; Smith, Ralph C.; Wilson, Alyson G.; Jones, Jacob L.

doi:10.1007/978-3-319-99465-9_4

Bayesian Approaches to Uncertainty Quantification and Structure Refinement from X-Ray Diffraction

Book · Fri Jan 15 04:00:00 EST 2021

DOI:https://doi.org/10.1007/978-3-319-99465-9_4· OSTI ID:1476077

Paterson, Alisa R.; Reich, Brian J.; Smith, Ralph C.; Wilson, Alyson G.; Jones, Jacob L. ^[1]

NCSU

Abstract not provided

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OSTI does not have a digital full text copy available. For more information, please see document availability, search WorldCat, or search Google Scholar.

Research Organization:: Advanced Photon Source (APS), Argonne National Laboratory (ANL), Argonne, IL (US)

Sponsoring Organization:: NSF

OSTI ID:: 1476077

Country of Publication:: United States

Language:: ENGLISH

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