Bayesian Approaches to Uncertainty Quantification and Structure Refinement from X-Ray Diffraction

Paterson, Alisa R.; Reich, Brian J.; Smith, Ralph C.; Wilson, Alyson G.; Jones, Jacob L.

doi:10.1007/978-3-319-99465-9_4

Title: Bayesian Approaches to Uncertainty Quantification and Structure Refinement from X-Ray Diffraction

Book · Fri Jan 15 00:00:00 EST 2021

DOI:https://doi.org/10.1007/978-3-319-99465-9_4· OSTI ID:1476077

Paterson, Alisa R.; Reich, Brian J.; Smith, Ralph C.; Wilson, Alyson G.; Jones, Jacob L. ^[1]

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Research Organization:: Argonne National Laboratory (ANL), Argonne, IL (United States). Advanced Photon Source (APS)

Sponsoring Organization:: National Science Foundation (NSF)

OSTI ID:: 1476077

Resource Relation:: Related Information: Materials Discovery and Design By Means of Data Science and Optimal Learning

Country of Publication:: United States

Language:: ENGLISH

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