Multilayer epitaxial nx(SrTiO{sub 3}/PbTiO{sub 3}) thin films and their properties prepared by the sol-gel technique

Conference · Sun Dec 31 04:00:00 EST 1995

OSTI ID:175518

Lou, Y; Xu, Y; Mackenzie, J D ^[1]

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1. Univ. of California, Los Angeles, CA (United States)

In this study, multilayer epitaxial ferroelectric PbTiO{sub 3} thin films and SrTiO{sub 3} thin films have been grown alternatively on single crystal SrTiO{sub 3} substrate by the sol-gel method. Lead titanium double metal alkoxide and strontium titanium double metal alkoxide were used as sol-gel precursors. The thickness of the multilayer thin films has been controlled by changing the concentration and coating speed of sol-gel solution. The average thickness of each PbTiO{sub 3} or SrTiO{sub 3} layer is measured by SEM. The change of transmittance with wavelength for a sample with 12(6 x [SrTiO{sub 3}/PbTiO{sub 3}]) layer films has been measured. By using XRD, SEM, and HRTEM method, the structure of the epitaxial multilayer films was examined. The epitaxial PbTiO{sub 3} and SrTiO{sub 3} thin films could be obtained at 700{degrees}C and 800{degrees}C respectively. The structure of the films and the relationship between the growth parameters are discussed.

• OSTI ID: 175518
• Report Number(s): CONF-9410372--; CNN: Grant AFOSR-91-0096
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
CRYSTALLIZATION
FERROELECTRIC MATERIALS
LATTICE PARAMETERS
LEAD COMPOUNDS
OPTICAL PROPERTIES
PHYSICAL PROPERTIES
SCANNING ELECTRON MICROSCOPY
STRONTIUM COMPOUNDS
THIN FILMS
TITANATES
X-RAY DIFFRACTION