Laser desorption tandem mass spectrometry of individual microparticles in an ion trap mass spectrometer

Journal Article · Thu Nov 30 23:00:00 EST 1995 · Analytical Chemistry (Washington)

DOI:https://doi.org/10.1021/ac00119a020· OSTI ID:171485

Yang, M; Dale, J M; Whitten, W B; Ramsey, J M ^[1]

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1. Oak Ridge National Lab., TN (United States)

A technique is described for tandem mass spectrometry of individual microparticles in an ion trap mass spectrometer. The particles are sampled by laser desorption/ablation after being injected into the center of the ion trap electrodes. The method is especially effective for the detection of trace levels of involatile organic molecules. Test particles were 100 {mu}m silicon carbide grains coated with tetraphenylphosphonium bromide. Mass spectra of the primary ions and fragment ions following collision-induced dissociation were measured. 30 refs., 6 figs.

• Sponsoring Organization: USDOE
• DOE Contract Number: AC05-84OR21400
• OSTI ID: 171485
• Journal Information: Analytical Chemistry (Washington), Journal Name: Analytical Chemistry (Washington) Journal Issue: 23 Vol. 67; ISSN ANCHAM; ISSN 0003-2700
• Country of Publication: United States
• Language: English

Related Subjects

40 CHEMISTRY
42 ENGINEERING
44 INSTRUMENTATION
INCLUDING NUCLEAR AND PARTICLE DETECTORS
ABLATION
DISSOCIATION
IONS
LASER RADIATION
MASS SPECTRA
MASS SPECTROMETERS
MASS SPECTROSCOPY
ORGANIC COMPOUNDS
PARTICULATES
QUANTITATIVE CHEMICAL ANALYSIS
SILICON CARBIDES
USES