Skip to main content
U.S. Department of Energy
Office of Scientific and Technical Information

Introductory guide to the application of XPS to epitaxial films and heterostructures

Journal Article · · Journal of Vacuum Science and Technology A
DOI:https://doi.org/10.1116/6.0000465· OSTI ID:1706673
 [1];  [1];  [2]
  1. Pacific Northwest National Lab. (PNNL), Richland, WA (United States)
  2. Pacific Northwest National Lab. (PNNL), Richland, WA (United States). Environmental Molecular Sciences Lab. (EMSL)
XPS is an important characterization method for epitaxial films and heterostructures. Although standard approaches to XPS data collection and analysis provide useful information such as average composition and the presence of contaminants, more in-depth analysis provides information about film structure, surface termination, built-in electric potentials and band offsets. The high degree of structural order in these materials enables such information to be extracted from spectral data but also adds complications to the analysis. This guide highlights three topics of importance in this field: i) the impacts of crystallinity on XPS signals and quantification, ii) the unexpected spectral line shapes that can occur in unusual or novel materials, and, iii) the ability of XPS to yield information about built-in potentials and band offsets. Concepts are demonstrated using complex oxide heterostructures. Although the topics are highly relevant to epitaxial films and heterostructures, they also apply to signal crystals of complex materials
Research Organization:
Pacific Northwest National Laboratory (PNNL), Richland, WA (United States)
Sponsoring Organization:
USDOE
Grant/Contract Number:
AC05-76RL01830
OSTI ID:
1706673
Report Number(s):
PNNL-SA-154604
Journal Information:
Journal of Vacuum Science and Technology A, Journal Name: Journal of Vacuum Science and Technology A Journal Issue: 6 Vol. 38; ISSN 0734-2101
Publisher:
American Vacuum Society / AIPCopyright Statement
Country of Publication:
United States
Language:
English

Similar Records

Introductory guide to backgrounds in XPS spectra and their impact on determining peak intensities
Journal Article · Tue Sep 22 20:00:00 EDT 2020 · Journal of Vacuum Science and Technology A · OSTI ID:1686061

X-ray photoelectron spectroscopy of epitaxial films and heterostructures
Journal Article · Sat Jul 13 20:00:00 EDT 2024 · Surface Science Reports · OSTI ID:2481687

Epitaxial heterostructures
Conference · Sun Dec 31 23:00:00 EST 1989 · OSTI ID:5524801

Related Subjects