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Micromachined Silicon Platform for Precise Assembly of 2D Multilayer Laue Lenses for High-Resolution X-ray Microscopy

Journal Article · · Micromachines
DOI:https://doi.org/10.3390/mi11100939· OSTI ID:1677518

We report on a developed micromachined silicon platform for the precise assembly of 2D multilayer Laue lenses (MLLs) for high-resolution X-ray microscopy. The platform is 10 × 10 mm2 and is fabricated on ~500 µm thick silicon wafers through multiple steps of photolithography and deep reactive-ion etching. The platform accommodates two linear MLLs in a pre-defined configuration with precise angular and lateral position control. In this work, we discuss the design and microfabrication of the platform, and characterization regarding MLLs assembly, position control, repeatability, and stability. The results demonstrate that a micromachined platform can be used for the assembly of a variety of MLLs with different dimensions and optical parameters. The angular misalignment of 2D MLLs is well controlled in the range of the designed accuracy, down to a few millidegrees. The separation distance between MLLs is adjustable from hundreds to more than one thousand micrometers. The use of the developed platform greatly simplifies the alignment procedure of the MLL optics and reduces the complexity of the X-ray microscope. It is a significant step forward for the development of monolithic 2D MLL nanofocusing optics for high-resolution X-ray microscopy.

Research Organization:
Brookhaven National Lab. (BNL), Upton, NY (United States). National Synchrotron Light Source II (NSLS-II)
Sponsoring Organization:
USDOE Office of Science (SC), Basic Energy Sciences (BES)
Grant/Contract Number:
SC0012704
OSTI ID:
1677518
Alternate ID(s):
OSTI ID: 1725765
Report Number(s):
BNL--220655-2020-JAAM; PII: mi11100939
Journal Information:
Micromachines, Journal Name: Micromachines Journal Issue: 10 Vol. 11; ISSN 2072-666X
Publisher:
MDPICopyright Statement
Country of Publication:
Switzerland
Language:
English

References (33)

Measuring Three-Dimensional Strain and Structural Defects in a Single InGaAs Nanowire Using Coherent X-ray Multiangle Bragg Projection Ptychography journal January 2018
Lanthanide-Binding Tags for 3D X-ray Imaging of Proteins in Cells at Nanoscale Resolution journal January 2020
X-ray focusing with efficient high-NA multilayer Laue lenses journal November 2017
Breaking the 10 nm barrier in hard-X-ray focusing journal November 2009
Multimodality hard-x-ray imaging of a chromosome with nanoscale spatial resolution journal February 2016
Bi-continuous pattern formation in thin films via solid-state interfacial dealloying studied by multimodal characterization journal January 2019
Focusing of hard x-rays to 16 nanometers with a multilayer Laue lens journal June 2008
Fabrication of multilayer Laue lenses by a combination of pulsed laser deposition and focused ion beam journal July 2010
Performance and characterization of the prototype nm-scale spatial resolution scanning multilayer Laue lenses microscope journal March 2013
Design and performance of a scanning ptychography microscope journal March 2014
Development and characterization of monolithic multilayer Laue lens nanofocusing optics journal June 2016
Fabrication and efficiency measurement of a Mo/C/Si/C three material system multilayer Laue lens journal March 2017
In-situ synchrotron x-ray studies of the microstructure and stability of In 2 O 3 epitaxial films journal October 2017
OMNY—A tOMography Nano crYo stage journal April 2018
Multilayer Laue Lens: A Brief History and Current Status journal July 2016
Hard x-ray nanofocusing by multilayer Laue lenses journal June 2014
Optomechanical Design of a Multilayer Laue Lens Test Bed for 10-nm Focusing of Hard X-rays journal October 2013
Multimodal hard x-ray imaging with resolution approaching 10 nm for studies in material science journal March 2018
Ptychography with multilayer Laue lenses journal August 2014
Pushing the limits: an instrument for hard X-ray imaging below 20 nm journal January 2015
ID16B: a hard X-ray nanoprobe beamline at the ESRF for nano-analysis journal January 2016
Point focusing with flat and wedged crossed multilayer Laue lenses journal February 2017
Design and performance of an X-ray scanning microscope at the Hard X-ray Nanoprobe beamline of NSLS-II journal October 2017
Multimodal X-ray imaging of grain-level properties and performance in a polycrystalline solar cell journal May 2019
Strain Mapping of CdTe Grains in Photovoltaic Devices journal November 2019
High-sensitivity nanoscale chemical imaging with hard x-ray nano-XANES journal September 2020
Optical Properties of MoSi 2 /Si Multilayer Laue Lens as Nanometer X-ray Focusing Device journal October 2008
Two dimensional hard x-ray nanofocusing with crossed multilayer Laue lenses journal January 2011
Full-field X-ray microscopy with crossed partial multilayer Laue lenses journal January 2014
Achieving diffraction-limited nanometer-scale X-ray point focus with two crossed multilayer Laue lenses: alignment challenges journal January 2017
2D MEMS-based multilayer Laue lens nanofocusing optics for high-resolution hard x-ray microscopy journal January 2020
Tunable hard x-ray nanofocusing with Fresnel zone plates fabricated using deep etching journal January 2020
Efficient concentration of high-energy x-rays for diffraction-limited imaging resolution journal January 2017

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