Deep Level Defect Spectroscopy in Reduced Dimension Semiconductor Materials and Devices.
Conference
·
OSTI ID:1661554
Abstract not provided.
- Research Organization:
- Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)
- Sponsoring Organization:
- USDOE National Nuclear Security Administration (NNSA)
- DOE Contract Number:
- AC04-94AL85000
- OSTI ID:
- 1661554
- Report Number(s):
- SAND2013-5323P; 457144
- Country of Publication:
- United States
- Language:
- English
Similar Records
Deep Level Defect Spectroscopy in Reduced Dimension Semiconductor Materials and Devices (invited).
Novel Applications of Deep Level Transient Spectroscopy (DLTS) for QASPR Devices.
Exploring the Effect of Defect Clustering using Deep Level Transient Spectroscopy on Silicon Transistors.
Conference
·
Mon Apr 01 00:00:00 EDT 2013
·
OSTI ID:1661062
Novel Applications of Deep Level Transient Spectroscopy (DLTS) for QASPR Devices.
Conference
·
Sun Nov 01 00:00:00 EDT 2015
·
OSTI ID:1332807
Exploring the Effect of Defect Clustering using Deep Level Transient Spectroscopy on Silicon Transistors.
Conference
·
Sat Oct 01 00:00:00 EDT 2016
·
OSTI ID:1408365