Full Information Acquisition in Scanning Probe Microscopy

Jesse, S.; Somnath, S.; Collins, L.; Kalinin, S. V.

doi:10.1017/s1551929517000633

Full Information Acquisition in Scanning Probe Microscopy

Journal Article · Thu Jul 06 00:00:00 EDT 2017 · Microscopy Today

DOI:https://doi.org/10.1017/s1551929517000633· OSTI ID:1649665

Jesse, S. ^[1]; Somnath, S. ^[1]; Collins, L. ^[1]; Kalinin, S. V. ^[1]

Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States). Center for Nanophase Materials Sciences (CNMS) and The Institute for Functional Imaging of Materials

Scanning Probe Microscopy (SPM) has unlocked the nanoworld for exploration and control. While substantial effort has been dedicated towards the development of better instrumental platforms and probes, opportunities related to signal processing and data acquisition in SPMareoftenoverlooked. In this work, we discuss opportunities offered by capturing the full information of thedata stream from the detector, referred to as General Mode (G-Mode) SPM. This approach allows exploration of the complex tip-surface interactions, spatial mapping of multidimensional variability of material properties and their mutual interactions, and imaging at the information channel capacity limit, providing a new paradigm for SPM detection.

View Accepted Manuscript (DOE)

Research Organization:: Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States). Center for Nanophase Materials Science (CNMS)

Sponsoring Organization:: USDOE Office of Science (SC)

Grant/Contract Number:: AC05-00OR22725

OSTI ID:: 1649665

Journal Information:: Microscopy Today, Journal Name: Microscopy Today Journal Issue: 4 Vol. 25; ISSN 1551-9295

Publisher:: Cambridge University PressCopyright Statement

Country of Publication:: United States

Language:: English

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