Causal analysis of competing atomistic mechanisms in ferroelectric materials from high-resolution scanning transmission electron microscopy data

Ziatdinov, Maxim; Nelson, Christopher T.; Zhang, Xiaohang; Vasudevan, Rama K.; Eliseev, Eugene; Morozovska, Anna N.; Takeuchi, Ichiro; Kalinin, Sergei V.

doi:10.1038/s41524-020-00396-2

Causal analysis of competing atomistic mechanisms in ferroelectric materials from high-resolution scanning transmission electron microscopy data

Journal Article · Fri Aug 21 00:00:00 EDT 2020 · npj Computational Materials

DOI:https://doi.org/10.1038/s41524-020-00396-2· OSTI ID:1648585

; ; ; Vasudevan, Rama K.; ; ; Takeuchi, Ichiro;

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Research Organization:: Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)

Sponsoring Organization:: European Union (EU); National Institute of Standards and Technology (NIST); National Science Foundation (NSF); USDOE Office of Science (SC), Basic Energy Sciences (BES)

Grant/Contract Number:: AC05-00OR22725

OSTI ID:: 1648585

Alternate ID(s):: OSTI ID: 1657979

Journal Information:: npj Computational Materials, Journal Name: npj Computational Materials Journal Issue: 1 Vol. 6; ISSN 2057-3960

Publisher:: Nature Publishing GroupCopyright Statement

Country of Publication:: United Kingdom

Language:: English

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