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U.S. Department of Energy
Office of Scientific and Technical Information

Deep learning for automated defect detection in high-reliability electronic parts.

Conference ·
DOI:https://doi.org/10.1117/12.2529584· OSTI ID:1641567

Abstract not provided.

Research Organization:
Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)
Sponsoring Organization:
USDOE National Nuclear Security Administration (NNSA)
DOE Contract Number:
AC04-94AL85000
OSTI ID:
1641567
Report Number(s):
SAND2019-9331C; 678325
Country of Publication:
United States
Language:
English

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