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Sub-surface imaging of atomically-thin semiconductors beneath dielectrics based on optical standing wave using PEEM with deep-UV photoexcitation.

Conference ·
OSTI ID:1639694
Abstract not provided.
Research Organization:
Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)
Sponsoring Organization:
USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22)
DOE Contract Number:
AC04-94AL85000
OSTI ID:
1639694
Report Number(s):
SAND2019-3889C; 674477
Country of Publication:
United States
Language:
English