Electrical and Optical Characterization of Ultrathin Tellurium Nanostructures Synthesized by Vapor Phase Deposition.
Conference
·
OSTI ID:1639256
- SNL
Abstract not provided.
- Research Organization:
- Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)
- Sponsoring Organization:
- USDOE National Nuclear Security Administration (NNSA)
- DOE Contract Number:
- AC04-94AL85000
- OSTI ID:
- 1639256
- Report Number(s):
- SAND2019-2302C; 673048
- Country of Publication:
- United States
- Language:
- English
Similar Records
Optical and Electrical Characterization of Ultrathin Tellurium Nanowires Synthesized by Vapor Phase Deposition.
Assembly and electrical transport characterization of nanostructures.
Electrical Characterization of Silicon-Rich Nitride and Silicon Oxynitride Films Deposited by Low-Pressure Chemical Vapor Deposition.
Conference
·
Fri Jun 01 00:00:00 EDT 2018
·
OSTI ID:1529842
Assembly and electrical transport characterization of nanostructures.
Conference
·
Sun Jul 01 00:00:00 EDT 2007
·
OSTI ID:1147806
Electrical Characterization of Silicon-Rich Nitride and Silicon Oxynitride Films Deposited by Low-Pressure Chemical Vapor Deposition.
Conference
·
Mon Oct 31 23:00:00 EST 2005
·
OSTI ID:1728541