Incorporation of erbium ions into thin-film lithium niobate integrated photonics

Wang, Sihao; Yang, Likai; Cheng, Risheng; Xu, Yuntao; Shen, Mohan; Cone, Rufus L.; Thiel, Charles W.; Tang, Hong X.

doi:10.1063/1.5142631

Title: Incorporation of erbium ions into thin-film lithium niobate integrated photonics

Journal Article · Mon Apr 13 00:00:00 EDT 2020 · Applied Physics Letters

DOI:https://doi.org/10.1063/1.5142631· OSTI ID:1803795

Wang, Sihao ^[1]; Yang, Likai ^[1]; Cheng, Risheng ^[1]; Xu, Yuntao ^[1]; Shen, Mohan ^[1]; Cone, Rufus L. ^[2]; Thiel, Charles W. ^[2];

^[1]

Yale Univ., New Haven, CT (United States)
Montana State Univ., Bozeman, MT (United States)

As an active material with favorable linear and nonlinear optical properties, thin-film lithium niobate has demonstrated its potential in integrated photonics. Integration with rare-earth ions, which are promising candidates for quantum memories and transducers, will enrich the system with new applications in quantum information processing. In this work, we investigate the optical properties at 1.5 μm wavelengths of rare-earth ions (Er³⁺) implanted in thin-film lithium niobate waveguides and micro-ring resonators. Optical quality factors near a million after post-annealing show that ion implantation damage can be repaired. The transition linewidth and fluorescence lifetime of erbium ions are characterized. The ion-cavity coupling is observed through a Purcell enhanced fluorescence from which a Purcell factor of 3.8 ± 0.5, compared with waveguide lifetime, is extracted. This platform is compatible with top-down lithography processes and leads to a scalable path for controlling spin-photon interfaces in photonic circuits.

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Research Organization:: Yale Univ., New Haven, CT (United States)

Sponsoring Organization:: USDOE Office of Science (SC), Basic Energy Sciences (BES). Materials Sciences & Engineering Division; USDOE

Grant/Contract Number:: SC0019406

OSTI ID:: 1803795

Alternate ID(s):: OSTI ID: 1632960

Journal Information:: Applied Physics Letters, Vol. 116, Issue 15; ISSN 0003-6951

Publisher:: American Institute of Physics (AIP)Copyright Statement

Country of Publication:: United States

Language:: English

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Cited by: 36 works

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