Implementation of Talbot–Lau x-ray deflectometry in the pulsed power environment using a copper X-pinch backlighter

Vescovi, Milenko; Valdivia, Maria Pia; Veloso, Felipe; Stutman, Dan; Favre, Mario

doi:10.1063/5.0001910

Implementation of Talbot–Lau x-ray deflectometry in the pulsed power environment using a copper X-pinch backlighter

Journal Article · Fri May 29 04:00:00 EDT 2020 · Journal of Applied Physics

DOI:https://doi.org/10.1063/5.0001910· OSTI ID:1631998

Vescovi, Milenko ^[1]; ^[2]; ^[3]; Stutman, Dan ^[2]; ^[3]

Pontificia Universidad Católica de Chile, Santiago (Chile); Johns Hopkins University
Johns Hopkins Univ., Baltimore, MD (United States)
Pontificia Universidad Católica de Chile, Santiago (Chile)

A Talbot–Lau x-ray deflectometer can map electron density gradients in high energy density plasmas, as well as provide information about plasma elemental composition through single-image x-ray refraction and attenuation measurements. A new adaptation to a pulsed power environment used backlighting from copper X-pinches, allowing for electron density mapping of a low-Z object. Even though the X-pinch backlighter is not properly optimized for emitting x-rays in terms of source size and photon fluence, Moire fringe patterns with contrast up to 14% and fringe shift due to refraction on a beryllium object are obtained. Due to the proximity of the deflectometer with the X-pinch (~6 cm), it is shown that a protective filter is required to avoid damage in the closest (i.e., source) grating due to both plasma debris and mechanical shock. Regarding grating survival, these did not show any damage due to the intense magnetic field or heating induced by plasma radiation. Electron density on beryllium was measured with a difference lower than 16%. The areal electron density mapping of the sample was limited by source size characteristics, in similarity to transmission radiography. These results show the potential of plasma electron density as well as material mapping through Talbot–Lau x-ray deflectometry in a pulsed power environment.

View Accepted Manuscript (DOE)

Research Organization:: Johns Hopkins Univ., Baltimore, MD (United States)

Sponsoring Organization:: USDOE National Nuclear Security Administration (NNSA); Comisión Nacional de Investigación Científica y Tecnológica (CONICYT); National Fund for Scientific and Technological Development (FONDECYT)

Grant/Contract Number:: NA0003882; NA0002955

OSTI ID:: 1631998

Alternate ID(s):: OSTI ID: 1630457

Journal Information:: Journal of Applied Physics, Journal Name: Journal of Applied Physics Journal Issue: 20 Vol. 127; ISSN 0021-8979

Publisher:: American Institute of Physics (AIP)Copyright Statement

Country of Publication:: United States

Language:: English

References (35)

X-Ray Interactions: Photoabsorption, Scattering, Transmission, and Reflection at E = 50-30,000 eV, Z = 1-92 Henke, B. L.; Gullikson, E. M.; Davis, J. C. Atomic Data and Nuclear Data Tables, Vol. 54, Issue 2, p. 181-342 https://doi.org/10.1006/adnd.1993.1013	journal	July 1993
Development of phase-contrast X-ray imaging techniques and potential medical applications Zhou, Shu-Ang; Brahme, Anders Physica Medica, Vol. 24, Issue 3, p. 129-148 https://doi.org/10.1016/j.ejmp.2008.05.006	journal	September 2008
LLAMPÜDKEÑ: A high-current, low-impedance pulser employing an auxiliary exponential transmission line Chuaqui, H.; Wyndham, E.; Friedli, C. Laser and Particle Beams, Vol. 15, Issue 2 https://doi.org/10.1017/S0263034600010569	journal	June 1997
Phase retrieval and differential phase-contrast imaging with low-brilliance X-ray sources Pfeiffer, Franz; Weitkamp, Timm; Bunk, Oliver Nature Physics, Vol. 2, Issue 4, p. 258-261 https://doi.org/10.1038/nphys265	journal	March 2006
X ‐pinch soft x‐ray source for microlithography Hammer, D. A.; Kalantar, D. H.; Mittal, K. C. Applied Physics Letters, Vol. 57, Issue 20 https://doi.org/10.1063/1.103948	journal	November 1990
The x ‐pinch as a point source of x rays for backlighting Kalantar, D. H.; Hammer, D. A. Review of Scientific Instruments, Vol. 66, Issue 1 https://doi.org/10.1063/1.1146219	journal	January 1995
High-luminosity monochromatic x-ray backlighting using an incoherent plasma source to study extremely dense plasmas (invited) Pikuz, S. A.; Shelkovenko, T. A.; Romanova, V. M. Review of Scientific Instruments, Vol. 68, Issue 1 https://doi.org/10.1063/1.1147689	journal	January 1997
X-ray backlighting of wire array Z -pinch implosions using X pinch Lebedev, S. V.; Beg, F. N.; Bland, S. N. Review of Scientific Instruments, Vol. 72, Issue 1 https://doi.org/10.1063/1.1315647	journal	January 2001
Point-projection x-ray radiography using an X pinch as the radiation source Shelkovenko, T. A.; Sinars, D. B.; Pikuz, S. A. Review of Scientific Instruments, Vol. 72, Issue 1 https://doi.org/10.1063/1.1323252	journal	January 2001
Radiographic and spectroscopic studies of X-pinch plasma implosion dynamics and x-ray burst emission characteristics Shelkovenko, T. A.; Sinars, D. B.; Pikuz, S. A. Physics of Plasmas, Vol. 8, Issue 4 https://doi.org/10.1063/1.1351553	journal	January 2001
Slit-wire camera, a new diagnostics method for measurement of small scale high-energy density structures in hot plasmas Choi, P.; Dumitrescu, C.; Wyndham, E. Review of Scientific Instruments, Vol. 73, Issue 6 https://doi.org/10.1063/1.1480462	journal	June 2002
Extreme ultraviolet imaging of wire array z-pinch experiments Bland, S. N.; Ampleford, D. J.; Bott, S. C. Review of Scientific Instruments, Vol. 75, Issue 10 https://doi.org/10.1063/1.1787926	journal	October 2004
Pulsed-power-driven high energy density physics and inertial confinement fusion research Matzen, M. Keith; Sweeney, M. A.; Adams, R. G. Physics of Plasmas, Vol. 12, Issue 5 https://doi.org/10.1063/1.1891746	journal	May 2005
A Compact X-pinch X-ray Source for Characterization of Inertial Confinement Fusion Capsules Beg, F. N. DENSE Z-PINCHES: 6th International Conference on Dense Z-Pinches, AIP Conference Proceedings https://doi.org/10.1063/1.2159335	conference	January 2006
Compact X-pinch based point x-ray source for phase contrast imaging of inertial confinement fusion capsules Beg, F. N.; Stephens, R. B.; Xu, H. -W. Applied Physics Letters, Vol. 89, Issue 10 https://doi.org/10.1063/1.2335959	journal	September 2006
Perspectives on high-energy-density physics Drake, R. P. Physics of Plasmas, Vol. 16, Issue 5 https://doi.org/10.1063/1.3078101	journal	May 2009
Talbot-Lau based Moiré deflectometry with non-coherent sources as potential High Energy Density plasma diagnostic Valdivia, M. P.; Stutman, D.; Finkenthal, M. Journal of Applied Physics, Vol. 114, Issue 16 https://doi.org/10.1063/1.4827186	journal	October 2013
Moiré deflectometry using the Talbot-Lau interferometer as refraction diagnostic for High Energy Density plasmas at energies below 10 keV Valdivia, M. P.; Stutman, D.; Finkenthal, M. Review of Scientific Instruments, Vol. 85, Issue 7 https://doi.org/10.1063/1.4885467	journal	July 2014
An x-ray backlit Talbot-Lau deflectometer for high-energy-density electron density diagnostics Valdivia, M. P.; Stutman, D.; Stoeckl, C. Review of Scientific Instruments, Vol. 87, Issue 2 https://doi.org/10.1063/1.4941441	journal	February 2016
Talbot-Lau x-ray deflectometer electron density diagnostic for laser and pulsed power high energy density plasma experiments (invited) Valdivia, M. P.; Stutman, D.; Stoeckl, C. Review of Scientific Instruments, Vol. 87, Issue 11 https://doi.org/10.1063/1.4959158	journal	July 2016
Implementation of a Talbot–Lau x-ray deflectometer diagnostic platform for the OMEGA EP laser Valdivia, M. P.; Stutman, D.; Stoeckl, C. Review of Scientific Instruments, Vol. 91, Issue 2 https://doi.org/10.1063/1.5123919	journal	February 2020
Precise measurement of the temperature of a silicon wafer by an optical-interference contactless thermometer during rapid plasma processing Kameda, Asaki; Mizukawa, Yuri; Hanafusa, Hiroaki Journal of Applied Physics, Vol. 127, Issue 20 https://doi.org/10.1063/1.5143834	journal	May 2020
A wide band porous silicon omnidirectional mirror for the near infrared range Chavez-Castillo, B. A.; Pérez-Huerta, J. S.; Madrigal-Melchor, J. Journal of Applied Physics, Vol. 127, Issue 20 https://doi.org/10.1063/1.5144621	journal	May 2020
A review of the dense Z -pinch Haines, M. G. Plasma Physics and Controlled Fusion, Vol. 53, Issue 9 https://doi.org/10.1088/0741-3335/53/9/093001	journal	June 2011
Experimental Demonstration of Fusion-Relevant Conditions in Magnetized Liner Inertial Fusion Gomez, M. R.; Slutz, S. A.; Sefkow, A. B. Physical Review Letters, Vol. 113, Issue 15 https://doi.org/10.1103/PhysRevLett.113.155003	journal	October 2014
Electron Density Measurements of High Density Plasmas Using Soft X-Ray Laser Interferometry Da Silva, L. B.; Barbee, Jr., T. W.; Cauble, R. Physical Review Letters, Vol. 74, Issue 20 https://doi.org/10.1103/PhysRevLett.74.3991	journal	May 1995
Study of New Configurations of Hybrid $X$ Pinches Shelkovenko, Tatiana A.; Pikuz, Sergey A.; Hoyt, Cad L. IEEE Transactions on Plasma Science, Vol. 42, Issue 3 https://doi.org/10.1109/TPS.2014.2300335	journal	March 2014
The fractional Talbot effect in differential x-ray phase-contrast imaging for extended and polychromatic x-ray sources Engelhardt, M.; Kottler, C.; Bunk, O. Journal of Microscopy, Vol. 232, Issue 1, p. 145-157 https://doi.org/10.1111/j.1365-2818.2008.02072.x	journal	October 2008
XWFP: an x-ray wavefront propagation software package for the IDL computer language Weitkamp, Timm; Sanchez del Rio, Manuel https://doi.org/10.1117/12.569642	conference	October 2004
Symmetric Inertial Confinement Fusion Implosions at Ultra-High Laser Energies Glenzer, S. H.; MacGowan, B. J.; Michel, P. Science, Vol. 327, Issue 5970 https://doi.org/10.1126/science.1185634	journal	January 2010
X-pinch. Part II Pikuz, S. A.; Shelkovenko, T. A.; Hammer, D. A. Plasma Physics Reports, Vol. 41, Issue 6 https://doi.org/10.1134/S1063780X15060045	journal	June 2015
A review of projection radiography of plasma and biological objects in X-Pinch radiation Shelkovenko, T. A.; Pikuz, S. A.; Hammer, D. A. Plasma Physics Reports, Vol. 42, Issue 3 https://doi.org/10.1134/S1063780X16030065	journal	March 2016
Differential Phase X-ray Imaging Microscopy with X-ray Talbot Interferometer Takeda, Yoshihiro; Yashiro, Wataru; Hattori, Tadashi Applied Physics Express, Vol. 1 https://doi.org/10.1143/APEX.1.117002	journal	October 2008
Single-shot Z_eff dense plasma diagnostic through simultaneous refraction and attenuation measurements with a Talbot–Lau x-ray moiré deflectometer Valdivia, M. P.; Stutman, D.; Finkenthal, M. Applied Optics, Vol. 54, Issue 10 https://doi.org/10.1364/AO.54.002577	journal	January 2015
X-ray phase imaging with a grating interferometer Weitkamp, Timm; Diaz, Ana; David, Christian Optics Express, Vol. 13, Issue 16 https://doi.org/10.1364/OPEX.13.006296	journal	January 2005

Similar Records

X-ray backlighter requirements for refraction-based electron density diagnostics through Talbot-Lau deflectometry

Journal Article · Thu Oct 25 00:00:00 EDT 2018 · Review of Scientific Instruments · OSTI ID:1502138

Talbot-Lau X-ray Deflectometer electron density diagnostic for laser and pulsed power high energy density plasma experiments

Journal Article · Thu Apr 21 00:00:00 EDT 2016 · IEEE Transactions on Plasma Science · OSTI ID:1258592

Moiré deflectometry using the Talbot-Lau interferometer as refraction diagnostic for High Energy Density plasmas at energies below 10 keV

Journal Article · Tue Jul 15 00:00:00 EDT 2014 · Review of Scientific Instruments · OSTI ID:22308827

Related Subjects

71 CLASSICAL AND QUANTUM MECHANICS
GENERAL PHYSICS
High energy density physics
Plasma diagnostics
Plasma production
Time resolved imaging
X-ray diagnostics
X-ray optics

Implementation of Talbot–Lau x-ray deflectometry in the pulsed power environment using a copper X-pinch backlighter

Citation Formats

References (35)

Similar Records

Related Subjects