Postprocessing Algorithm for Driving Conventional Scanning Tunneling Microscope at Fast Scan Rates

Zhang, Hao; Li, Xianqi; Chen, Yunmei; Park, Jewook; Li, An-Ping; Zhang, X. -G.

doi:10.1155/2017/1097142

Postprocessing Algorithm for Driving Conventional Scanning Tunneling Microscope at Fast Scan Rates

Journal Article · Mon Nov 20 04:00:00 EST 2017 · Scanning

DOI:https://doi.org/10.1155/2017/1097142· OSTI ID:1626232

Zhang, Hao ^[1]; Li, Xianqi ^[2]; ^[2]; Park, Jewook ^[3]; Li, An-Ping ^[4]; ^[5]

Univ. of Florida, Gainesville, FL (United States) Dept. of Mathematics; DOE/OSTI
Univ. of Florida, Gainesville, FL (United States) Dept. of Mathematics
Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States). Center for Nanophase Materials Sciences (CNMS); Inst. of Basic Science, Pohang (Korea, Republic of). Center for Artificial Low Dimensional Electronic Systems
Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States). Center for Nanophase Materials Sciences (CNMS)
Univ. of Florida, Gainesville, FL (United States). Dept. of Physics and the Quantum Theory Project

We present an image postprocessing framework for Scanning Tunneling Microscope (STM) to reduce the strong spurious oscillations and scan line noise at fast scan rates and preserve the features, allowing an order of magnitude increase in the scan rate without upgrading the hardware. The proposed method consists of two steps for large scale images and four steps for atomic scale images. For large scale images, we first apply for each line an image registration method to align the forward and backward scans of the same line. In the second step we apply a “rubber band” model which is solved by a novel Constrained Adaptive and Iterative Filtering Algorithm (CIAFA). The numerical results on measurement from copper(111) surface indicate the processed images are comparable in accuracy to data obtained with a slow scan rate, but are free of the scan drift error commonly seen in slow scan data. For atomic scale images, an additional first step to remove line-by-line strong background fluctuations and a fourth step of replacing the postprocessed image by its ranking map as the final atomic resolution image are required. The resulting image restores the lattice image that is nearly undetectable in the original fast scan data.

View Accepted Manuscript (DOE)

Research Organization:: Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States). Center for Nanophase Materials Sciences (CNMS); Univ. of Florida, Gainesville, FL (United States)

Sponsoring Organization:: USDOE Office of Science (SC)

Grant/Contract Number:: AC05-00OR22725

OSTI ID:: 1626232

Journal Information:: Scanning, Journal Name: Scanning Vol. 2017; ISSN 0161-0457

Publisher:: HindawiCopyright Statement

Country of Publication:: United States

Language:: English

References (16)

Cu and Cu-Based Nanoparticles: Synthesis and Applications in Catalysis Gawande, Manoj B.; Goswami, Anandarup; Felpin, François-Xavier Chemical Reviews, Vol. 116, Issue 6 https://doi.org/10.1021/acs.chemrev.5b00482	journal	March 2016
Kondo-free mirages in elliptical quantum corrals Li, Qili; Li, Xiaoxia; Miao, Bingfeng Nature Communications, Vol. 11, Issue 1 https://doi.org/10.1038/s41467-020-15137-8	journal	March 2020
Self-Organized and Cu-Coordinated Surface Linear Polymerization Li, Qing; Owens, Jonathan R.; Han, Chengbo Scientific Reports, Vol. 3, Issue 1 https://doi.org/10.1038/srep02102	journal	July 2013
Atomic resolution ultrafast scanning tunneling microscope with scan rate breaking the resonant frequency of a quartz tuning fork resonator Li, Quanfeng; Lu, Qingyou Review of Scientific Instruments, Vol. 82, Issue 5 https://doi.org/10.1063/1.3585200	journal	May 2011
The FAST module: An add-on unit for driving commercial scanning probe microscopes at video rate and beyond Esch, Friedrich; Dri, Carlo; Spessot, Alessio Review of Scientific Instruments, Vol. 82, Issue 5 https://doi.org/10.1063/1.3585984	journal	May 2011
Controlling the Dynamics of a Single Atom in Lateral Atom Manipulation Stroscio, J. A. Science, Vol. 306, Issue 5694 https://doi.org/10.1126/science.1102370	journal	October 2004
Unusual ultralow frequency fluctuations in freestanding graphene Xu, P.; Neek-Amal, M.; Barber, S. D. arXiv https://doi.org/10.48550/arxiv.1412.4822	text	January 2014
Inducing Single-Molecule Chemical Reactions with a UHV-STM: A New Dimension for Nano-Science and Technology Hla, Saw-Wai; Meyer, Gerhard; Rieder, Karl-Heinz ChemPhysChem, Vol. 2, Issue 6 https://doi.org/10.1002/1439-7641(20010618)2:6<361::AID-CPHC361>3.0.CO;2-N	journal	June 2001
STM-TIP induced surface diffusion of copper on copper (100) Dulot, F.; Eugène, J.; Kierren, B. Applied Surface Science, Vol. 162-163 https://doi.org/10.1016/S0169-4332(00)00175-6	journal	August 2000
Scattering and absorption of surface electron waves in quantum corrals Heller, E. J.; Crommie, M. F.; Lutz, C. P. Nature, Vol. 369, Issue 6480, p. 464-466 https://doi.org/10.1038/369464a0	journal	June 1994
Unusual ultra-low-frequency fluctuations in freestanding graphene Xu, P.; Neek-Amal, M.; Barber, S. D. Nature Communications, Vol. 5, Issue 1 https://doi.org/10.1038/ncomms4720	journal	April 2014
Scanning probe microscopes go video rate and beyond Rost, M. J.; Crama, L.; Schakel, P. Review of Scientific Instruments, Vol. 76, Issue 5 https://doi.org/10.1063/1.1915288	journal	May 2005
Conductivity map from scanning tunneling potentiometry Zhang, Hao; Li, Xianqi; Chen, Yunmei Review of Scientific Instruments, Vol. 87, Issue 8 https://doi.org/10.1063/1.4960081	journal	August 2016
Theory and Application for the Scanning Tunneling Microscope Tersoff, J.; Hamann, D. R. Physical Review Letters, Vol. 50, Issue 25 https://doi.org/10.1103/PhysRevLett.50.1998	journal	June 1983
“Live” Surface Ferromagnetism in Fe Nanodots/Cu Multilayers on Cu(111) Torija, M. A.; Li, A. P.; Guan, X. C. Physical Review Letters, Vol. 95, Issue 25 https://doi.org/10.1103/PhysRevLett.95.257203	journal	December 2005
A fast two-dimensional median filtering algorithm Huang, T.; Yang, G.; Tang, G. IEEE Transactions on Acoustics, Speech, and Signal Processing, Vol. 27, Issue 1, p. 13-18 https://doi.org/10.1109/TASSP.1979.1163188	journal	February 1979

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