Nanoscale x-ray and electron tomography

Yan, Hanfei; Voorhees, Peter W.; Xin, Huolin L.

doi:10.1557/mrs.2020.90

Nanoscale x-ray and electron tomography

Journal Article · Sun Sep 27 04:00:00 EDT 2020 · MRS Bulletin

DOI:https://doi.org/10.1557/mrs.2020.90· OSTI ID:1619248

Yan, Hanfei ^[1]; Voorhees, Peter W. ^[2]; Xin, Huolin L. ^[3]

Brookhaven National Lab. (BNL), Upton, NY (United States). National Synchrotron Light Source II (NSLS-II)
Northwestern Univ., Evanston, IL (United States)
Univ. of California, Irvine, CA (United States)

We present that three-dimensional (3D) tomographic imaging of the structural, chemical, and physical properties of a material provides key knowledge that links the structure of a material to both its processing and structure that is central to studies across a broad spectrum of materials. For many decades, tomography using x-rays or electrons has proven to be an essential 3D characterization tool. In recent years, advances in technology have significantly pushed the envelope of these techniques in many respects, enabling new imaging capabilities at the nanometer and atomic scale. This article highlights several such developments in nanoscale x-ray and electron tomography. The five articles that appear in this issue of MRS Bulletin discuss research frontiers that include multimodal x-ray tomography at the nanoscale, x-ray spectroscopic tomography, dark-field x-ray microscopy, electron nanotomography for functional nanomaterials, and atomistic imaging by electron tomography. Lastly, these articles give a holistic view of the status of these techniques and promising future directions, as well highlighting their applications for scientific problems.

View Accepted Manuscript (DOE)

Research Organization:: Brookhaven National Laboratory (BNL), Upton, NY (United States)

Sponsoring Organization:: USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22)

Grant/Contract Number:: SC0012704

OSTI ID:: 1619248

Report Number(s):: BNL-215924-2020-JAAM

Journal Information:: MRS Bulletin, Journal Name: MRS Bulletin Journal Issue: 4 Vol. 45; ISSN 0883-7694

Publisher:: Materials Research SocietyCopyright Statement

Country of Publication:: United States

Language:: English

References (47)

3D electron microscopy in the physical sciences: the development of Z-contrast and EFTEM tomography Midgley, P. A.; Weyland, M. Ultramicroscopy, Vol. 96, Issue 3-4 https://doi.org/10.1016/S0304-3991(03)00105-0	journal	September 2003
Exploring novel deformation mechanisms in aluminum–copper alloys using in situ 4D nanomechanical testing Kaira, C. Shashank; Stannard, Tyler J.; De Andrade, Vincent Acta Materialia, Vol. 176 https://doi.org/10.1016/j.actamat.2019.07.016	journal	September 2019
Deepfakes: Trick or treat? Kietzmann, Jan; Lee, Linda W.; McCarthy, Ian P. Business Horizons, Vol. 63, Issue 2 https://doi.org/10.1016/j.bushor.2019.11.006	journal	March 2020
Automated batch fiducial-less tilt-series alignment in Appion using Protomo Noble, Alex J.; Stagg, Scott M. Journal of Structural Biology, Vol. 192, Issue 2 https://doi.org/10.1016/j.jsb.2015.10.003	journal	November 2015
Optimizing convolutional neural networks to perform semantic segmentation on large materials imaging datasets: X-ray tomography and serial sectioning Stan, Tiberiu; Thompson, Zachary T.; Voorhees, Peter W. Materials Characterization, Vol. 160 https://doi.org/10.1016/j.matchar.2020.110119	journal	February 2020
3D imaging of nanomaterials by discrete tomography Batenburg, K. J.; Bals, S.; Sijbers, J. Ultramicroscopy, Vol. 109, Issue 6 https://doi.org/10.1016/j.ultramic.2009.01.009	journal	May 2009
Electron tomography based on a total variation minimization reconstruction technique Goris, B.; Van den Broek, W.; Batenburg, K. J. Ultramicroscopy, Vol. 113 https://doi.org/10.1016/j.ultramic.2011.11.004	journal	February 2012
Compressed sensing electron tomography Leary, Rowan; Saghi, Zineb; Midgley, Paul A. Ultramicroscopy, Vol. 131 https://doi.org/10.1016/j.ultramic.2013.03.019	journal	August 2013
Sampling limits for electron tomography with sparsity-exploiting reconstructions Jiang, Yi; Padgett, Elliot; Hovden, Robert Ultramicroscopy, Vol. 186 https://doi.org/10.1016/j.ultramic.2017.12.010	journal	March 2018
A multiple scattering algorithm for three dimensional phase contrast atomic electron tomography Ren, David; Ophus, Colin; Chen, Michael Ultramicroscopy, Vol. 208 https://doi.org/10.1016/j.ultramic.2019.112860	journal	January 2020
Increasing the Dimensionality of In-situ Electron Microscopy Data Sets by On-the-fly and Analytical Electron Tomography Lin, Ruoqian; Han, Lili; Xin, Huolin L. Microscopy and Microanalysis, Vol. 22, Issue S3 https://doi.org/10.1017/S1431927616004475	journal	July 2016
Imaging Three-Dimensional Elemental Inhomogeneity in Pt–Ni Nanoparticles Using Spectroscopic Single Particle Reconstruction Wang, Yi-Chi; Slater, Thomas J. A.; Leteba, Gerard M. Nano Letters, Vol. 19, Issue 2 https://doi.org/10.1021/acs.nanolett.8b03768	journal	January 2019
Electron tomography at 2.4-ångström resolution Scott, M. C.; Chen, Chien-Chun; Mecklenburg, Matthew Nature, Vol. 483, Issue 7390 https://doi.org/10.1038/nature10934	journal	March 2012
Surface patterning of nanoparticles with polymer patches Choueiri, Rachelle M.; Galati, Elizabeth; Thérien-Aubin, Héloïse Nature, Vol. 538, Issue 7623 https://doi.org/10.1038/nature19089	journal	August 2016
Visualization of anisotropic-isotropic phase transformation dynamics in battery electrode particles Wang, Jiajun; Karen Chen-Wiegart, Yu-chen; Eng, Christopher Nature Communications, Vol. 7, Issue 1 https://doi.org/10.1038/ncomms12372	journal	August 2016
Interrogation of bimetallic particle oxidation in three dimensions at the nanoscale Han, Lili; Meng, Qingping; Wang, Deli Nature Communications, Vol. 7, Issue 1 https://doi.org/10.1038/ncomms13335	journal	December 2016
Phase evolution for conversion reaction electrodes in lithium-ion batteries Lin, Feng; Nordlund, Dennis; Weng, Tsu-Chien Nature Communications, Vol. 5, Issue 1 https://doi.org/10.1038/ncomms4358	journal	February 2014
Electron tomography and holography in materials science Midgley, Paul A.; Dunin-Borkowski, Rafal E. Nature Materials, Vol. 8, Issue 4 https://doi.org/10.1038/nmat2406	journal	April 2009
Atomic-scale determination of surface facets in gold nanorods Goris, Bart; Bals, Sara; Van den Broek, Wouter Nature Materials, Vol. 11, Issue 11 https://doi.org/10.1038/nmat3462	journal	October 2012
Three-dimensional coordinates of individual atoms in materials revealed by electron tomography Xu, Rui; Chen, Chien-Chun; Wu, Li Nature Materials, Vol. 14, Issue 11 https://doi.org/10.1038/nmat4426	journal	September 2015
Prescribed nanoparticle cluster architectures and low-dimensional arrays built using octahedral DNA origami frames Tian, Ye; Wang, Tong; Liu, Wenyan Nature Nanotechnology, Vol. 10, Issue 7 https://doi.org/10.1038/nnano.2015.105	journal	May 2015
Nanoscale X-ray imaging Sakdinawat, Anne; Attwood, David Nature Photonics, Vol. 4, Issue 12, p. 840-848 https://doi.org/10.1038/nphoton.2010.267	journal	December 2010
Trace doping of multiple elements enables stable battery cycling of LiCoO2 at 4.6 V Zhang, Jie-Nan; Li, Qinghao; Ouyang, Chuying Nature Energy, Vol. 4, Issue 7 https://doi.org/10.1038/s41560-019-0409-z	journal	June 2019
Observing crystal nucleation in four dimensions using atomic electron tomography Zhou, Jihan; Yang, Yongsoo; Yang, Yao Nature, Vol. 570, Issue 7762 https://doi.org/10.1038/s41586-019-1317-x	journal	June 2019
GENFIRE: A generalized Fourier iterative reconstruction algorithm for high-resolution 3D imaging Pryor, Alan; Yang, Yongsoo; Rana, Arjun Scientific Reports, Vol. 7, Issue 1 https://doi.org/10.1038/s41598-017-09847-1	journal	September 2017
A joint deep learning model to recover information and reduce artifacts in missing-wedge sinograms for electron tomography and beyond Ding, Guanglei; Liu, Yitong; Zhang, Rui Scientific Reports, Vol. 9, Issue 1 https://doi.org/10.1038/s41598-019-49267-x	journal	September 2019
Three-dimensional mapping of nickel oxidation states using full field x-ray absorption near edge structure nanotomography Nelson, George J.; Harris, William M.; Izzo, John R. Applied Physics Letters, Vol. 98, Issue 17 https://doi.org/10.1063/1.3574774	journal	April 2011
One-minute nano-tomography using hard X-ray full-field transmission microscope Ge, Mingyuan; Coburn, David Scott; Nazaretski, Evgeny Applied Physics Letters, Vol. 113, Issue 8 https://doi.org/10.1063/1.5048378	journal	August 2018
Design, characterization, and performance of a hard x-ray transmission microscope at the National Synchrotron Light Source II 18-ID beamline Coburn, David Scott; Nazaretski, Evgeny; Xu, Weihe Review of Scientific Instruments, Vol. 90, Issue 5 https://doi.org/10.1063/1.5088124	journal	May 2019
Direct high-resolution mapping of electrocatalytic activity of semi-two-dimensional catalysts with single-edge sensitivity Sun, Tong; Wang, Dengchao; Mirkin, Michael V. Proceedings of the National Academy of Sciences https://doi.org/10.1073/pnas.1821091116	journal	May 2019
Low dose CT image restoration using a database of image patches Ha, Sungsoo; Mueller, Klaus Physics in Medicine and Biology, Vol. 60, Issue 2 https://doi.org/10.1088/0031-9155/60/2/869	journal	January 2015
The history and future of X-ray microscopy Kirz, J.; Jacobsen, C. Journal of Physics: Conference Series, Vol. 186 https://doi.org/10.1088/1742-6596/186/1/012001	journal	September 2009
Multimodal hard x-ray imaging with resolution approaching 10 nm for studies in material science Yan, Hanfei; Bouet, Nathalie; Zhou, Juan Nano Futures, Vol. 2, Issue 1 https://doi.org/10.1088/2399-1984/aab25d	journal	March 2018
Three-dimensional imaging of chemical phase transformations at the nanoscale with full-field transmission X-ray microscopy Meirer, Florian; Cabana, Jordi; Liu, Yijin Journal of Synchrotron Radiation, Vol. 18, Issue 5 https://doi.org/10.1107/S0909049511019364	journal	July 2011
Three-dimensional nanostructure determination from a large diffraction data set recorded using scanning electron nanodiffraction Meng, Yifei; Zuo, Jian-Min IUCrJ, Vol. 3, Issue 5 https://doi.org/10.1107/S205225251600943X	journal	July 2016
Development and Optimization of Regularized Tomographic Reconstruction Algorithms Utilizing Equally-Sloped Tomography Mao, Yu; Fahimian, Benjamin P.; Osher, Stanley J. IEEE Transactions on Image Processing, Vol. 19, Issue 5 https://doi.org/10.1109/TIP.2009.2039660	journal	May 2010
High-Resolution Scanning X-ray Diffraction Microscopy Thibault, P.; Dierolf, M.; Menzel, A. Science, Vol. 321, Issue 5887 https://doi.org/10.1126/science.1158573	journal	July 2008
The Race to X-ray Microbeam and Nanobeam Science Ice, G. E.; Budai, J. D.; Pang, J. W. L. Science, Vol. 334, Issue 6060 https://doi.org/10.1126/science.1202366	journal	December 2011
Full-field microimaging with 8 keV X-rays achieves a spatial resolutions better than 20 nm Chen, Tsung-Yu; Chen, Yu-Tung; Wang, Cheng-Liang Optics Express, Vol. 19, Issue 21 https://doi.org/10.1364/OE.19.019919	journal	January 2011
Image continuity at different levels of zoom for fringe patterns Abolbashari, Mehrdad; Gerges, Awad S.; Davies, Angela Optics Express, Vol. 20, Issue 1 https://doi.org/10.1364/OE.20.000007	journal	December 2011
Efficient concentration of high-energy x-rays for diffraction-limited imaging resolution Cesar da Silva, Julio; Pacureanu, Alexandra; Yang, Yang Optica, Vol. 4, Issue 5 https://doi.org/10.1364/OPTICA.4.000492	journal	January 2017
Advanced tomography techniques for inorganic, organic, and biological materials Evans, James E.; Friedrich, Heiner MRS Bulletin, Vol. 41, Issue 07 https://doi.org/10.1557/mrs.2016.134	journal	July 2016
Using plasmonically generated carriers as redox equivalents Yu, Sungju; Mohan, Varun; Jain, Prashant K. MRS Bulletin, Vol. 45, Issue 1 https://doi.org/10.1557/mrs.2019.293	journal	January 2020
Multimodal x-ray nanotomography Gürsoy, Doğa; Jacobsen, Chris MRS Bulletin, Vol. 45, Issue 4 https://doi.org/10.1557/mrs.2020.85	journal	April 2020
Electron tomography for functional nanomaterials Hovden, Robert; Muller, David A. MRS Bulletin, Vol. 45, Issue 4 https://doi.org/10.1557/mrs.2020.87	journal	April 2020
Atomic electron tomography in three and four dimensions Zhou, Jihan; Yang, Yongsoo; Ercius, Peter MRS Bulletin, Vol. 45, Issue 4 https://doi.org/10.1557/mrs.2020.88	journal	April 2020
Probing nanoscale structure and strain by dark-field x-ray microscopy Yildirim, Can; Cook, Phil; Detlefs, Carsten MRS Bulletin, Vol. 45, Issue 4 https://doi.org/10.1557/mrs.2020.89	journal	April 2020

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