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Effect of surface reconstruction on Fermi-level pinning in the Sn on Si(111) system

Journal Article · · Journal of Vacuum Science and Technology. B, Microelectronics Processing and Phenomena
DOI:https://doi.org/10.1116/1.586969· OSTI ID:161735
; ;  [1]
  1. Univ. of Wales College of Cardiff (United Kingdom); and others
We have performed detailed photoemission studies on the Si(111)({radical}3 X {radical}3)R30{degrees}-Sn and Si(111)(2{radical}3 X 2{radical}3)R30{degrees}-Sn reconstructed surfaces. Band bending is observed in both cases resulting in n-type Schottky barrier heights of (0.66{+-}0.09) and (0.99{+-}0.10) eV, respectively. In parallel, theoretical calculations using the self-consistent tight binding method in the extended Huckel approximation have been performed to determine the electronic structure and barrier heights at these reconstructed surfaces. The difference in barrier heights is found to be in excellent agreement with experiment. 21 refs., 4 figs., 2 tabs.
OSTI ID:
161735
Report Number(s):
CONF-930115--
Journal Information:
Journal of Vacuum Science and Technology. B, Microelectronics Processing and Phenomena, Journal Name: Journal of Vacuum Science and Technology. B, Microelectronics Processing and Phenomena Journal Issue: 4 Vol. 11; ISSN 0734-211X; ISSN JVTBD9
Country of Publication:
United States
Language:
English

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