Reflectivity and PDE of VUV4 Hamamatsu SiPMs in liquid xenon

Nakarmi, P.; Ostrovskiy, I.; Soma, A. K.; Retière, F.; Kharusi, S. Al; Alfaris, M.; Anton, G.; Arnquist, I. J.; Badhrees, I.; Barbeau, P. S.; Beck, D.; Belov, V.; Bhatta, T.; Blatchford, J.; Breur, P. A.; Brodsky, J. P.; Brown, E.; Brunner, T.; Mamahit, S. Byrne; Caden, E.; Cao, G. F.; Cao, L.; Chambers, C.; Chana, B.; Charlebois, S. A.; Chiu, M.; Cleveland, B.; Coon, M.; Craycraft, A.; Dalmasson, J.; Daniels, T.; Darroch, L.; Croix, A. De St.; Mesrobian-Kabakian, A. Der; DeVoe, R.; Vacri, M. L.  Di; Dilling, J.; Ding, Y. Y.; Dolinski, M. J.; Doria, L.; Dragone, A.; Echevers, J.; Edaltafar, F.; Elbeltagi, M.; Fabris, L.; Fairbank, D.; Fairbank, W.; Farine, J.; Ferrara, S.; Feyzbakhsh, S.; Fontaine, R.; Fucarino, A.; Gallina, G.; Gautam, P.; Giacomini, G.; Goeldi, D.; Gornea, R.; Gratta, G.; Hansen, E. V.; Heffner, M.; Hoppe, E. W.; Hößl, J.; House, A.; Hughes, M.; Iverson, A.; Jamil, A.; Jewell, M. J.; Jiang, X. S.; Karelin, A.; Kaufman, L. J.; Koffas, T.; Krücken, R.; Kuchenkov, A.; Kumar, K. S.; Lan, Y.; Larson, A.; Leach, K. G.; Lenardo, B. G.; Leonard, D. S.; Li, G.; Li, S.; Li, Z.; Licciardi, C.; Lv, P.; MacLellan, R.; Massacret, N.; McElroy, T.; Medina-Peregrina, M.; Michel, T.; Mong, B.; Moore, D. C.; Murray, K.; Natzke, C. R.; Newby, R. J.; Ning, Z.; Njoya, O.; Nolet, F.; Nusair, O.; Odgers, K.; Odian, A.; Oriunno, M.; Orrell, J. L.; Ortega, G. S.; Overman, C. T.; Parent, S.; Piepke, A.; Pocar, A.; Pratte, J. -F.; Radeka, V.; Raguzin, E.; Rescia, S.; Richman, M.; Robinson, A.; Rossignol, T.; Rowson, P. C.; Roy, N.; Runge, J.; Saldanha, R.; Sangiorgio, S.; VIII, K. Skarpaas; St-Hilaire, G.; Stekhanov, V.; Stiegler, T.; Sun, X. L.; Tarka, M.; Todd, J.; Totev, T. I.; Tsang, R.; Tsang, T.; Vachon, F.; Veeraraghavan, V.; Viel, S.; Visser, G.; Vivo-Vilches, C.; Vuilleumier, J. -L.; Wagenpfeil, M.; Wager, T.; Walent, M.; Wang, Q.; Ward, M.; Watkins, J.; Weber, M.; Wei, W.; Wen, L. J.; Wichoski, U.; Wu, S. X.; Wu, W. H.; Wu, X.; Xia, Q.; Yang, H.; Yang, L.; Zeldovich, O.; Zhao, J.; Zhou, Y.; Ziegler, T.

doi:10.1088/1748-0221/15/01/p01019

Title: Reflectivity and PDE of VUV4 Hamamatsu SiPMs in liquid xenon

Journal Article · Fri Jan 17 00:00:00 EST 2020 · Journal of Instrumentation

DOI:https://doi.org/10.1088/1748-0221/15/01/p01019· OSTI ID:1617159

Nakarmi, P.; Ostrovskiy, I.; Soma, A. K.; Retière, F.; Kharusi, S. Al; Alfaris, M.; Anton, G.; Arnquist, I. J.; Badhrees, I.; Barbeau, P. S.; Beck, D.; Belov, V.; Bhatta, T.; Blatchford, J.; Breur, P. A.; Brodsky, J. P.; Brown, E.; Brunner, T.; Mamahit, S. Byrne; Caden, E. more »

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Research Organization:: SLAC National Accelerator Laboratory (SLAC), Menlo Park, CA (United States); Univ. of Alabama, Tuscaloosa, AL (United States); Brookhaven National Laboratory (BNL), Upton, NY (United States); Stanford Univ., CA (United States); Lawrence Livermore National Laboratory (LLNL), Livermore, CA (United States)

Sponsoring Organization:: USDOE Office of Science (SC), Nuclear Physics (NP); Nvidia Corporation; National Science Foundation (NSF); Natural Sciences and Engineering Research Council of Canada (NSERC); Canada Foundation for Innovation (CFI); Fonds de recherche du Québec – Nature et technologies (FRQNT); National Research Council Canada (NRC); McDonald Institute (CFREF); Institute for Basic Science (IBS); Russian Foundation for Basic Research (RFBR); Chinese Academy of Sciences (CAS); National Natural Science Foundation of China (NSFC); USDOE National Nuclear Security Administration (NNSA)

Contributing Organization:: nEXO Collaboration; nEXO collaboration

Grant/Contract Number:: AC02-76SF00515; SC0019261; SC0017970; AC52-07NA27344; FG02-01ER41166

OSTI ID:: 1617159

Alternate ID(s):: OSTI ID: 1632393; OSTI ID: 1660466; OSTI ID: 1810644; OSTI ID: 1830771

Report Number(s):: BNL-215996-2020-JAAM; LLNL-JRNL-822165; TRN: US2106731

Journal Information:: Journal of Instrumentation, Vol. 15, Issue 01; ISSN 1748-0221

Publisher:: Institute of Physics (IOP)Copyright Statement

Country of Publication:: United States

Language:: English

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Cited by: 6 works

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References (26)

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