Skip to main content
U.S. Department of Energy
Office of Scientific and Technical Information

Low-voltage field emitter array cathode for high frequency applications

Journal Article · · Journal of Vacuum Science and Technology. B, Microelectronics Processing and Phenomena
DOI:https://doi.org/10.1116/1.586932· OSTI ID:161695
; ;  [1]
  1. Georgia Institute of Technology, Atlanta, GA (United States); and others
The composite-based low voltage field emitter cathode offers distinct advantages for high-frequency applications. It is based on a directionally solidified ZrO{sub 2}{center_dot}Y{sub 2}O{sub 3}-W eutectic composite containing aligned, single-crystal tungsten fibers, {approx}500 nm in diameter, with spatial densities of 2-50 X 10{sup 6}/cm{sup 2}. The composite can be etched to form fibers of virtually any length with tip radii of 5-10 nm. A gridded structure can be formed around the fibers using a line-of-sight vapor deposition process. Because of the thickness of the composite chips used as the substrate (0.5 mm) and the high resistivity of the oxide matrix, the insulator film can be made extremely thin, thereby reducing the extractor aperture radius. Emission tests have verified this configuration results in measurably higher field enhancement values for the arrays. 11 refs., 9 figs.
OSTI ID:
161695
Report Number(s):
CONF-930115--; CNN: Contract MDA972-91-C-0034
Journal Information:
Journal of Vacuum Science and Technology. B, Microelectronics Processing and Phenomena, Journal Name: Journal of Vacuum Science and Technology. B, Microelectronics Processing and Phenomena Journal Issue: 4 Vol. 11; ISSN JVTBD9; ISSN 0734-211X
Country of Publication:
United States
Language:
English

Similar Records

Low-voltage field emission from tungsten fiber arrays in a stabilized zirconia matrix
Journal Article · Fri May 01 00:00:00 EDT 1987 · J. Mat. Res.; (United States) · OSTI ID:6512322

Model for predicting the effects of device geometry on the capacitance of field emitter array cathodes
Journal Article · Thu Jul 01 00:00:00 EDT 1993 · Journal of Vacuum Science and Technology. B, Microelectronics Processing and Phenomena · OSTI ID:161692

Crack-interface interactions in a tungsten-yttria-stabilized-zirconia directionally solidified eutectic
Journal Article · Wed Jan 31 23:00:00 EST 1996 · Journal of the American Ceramic Society · OSTI ID:211701