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Two-phase liquid phase epitaxy of In{sub 0.53}Ga{sub 0.47}As on InP

Journal Article · · Journal of Vacuum Science and Technology. B, Microelectronics Processing and Phenomena
DOI:https://doi.org/10.1116/1.586922· OSTI ID:161686
;  [1]
  1. National Taiwan Univ., Taipei (Taiwan, Province of China)
The growth of the In{sub 0.53}Ga{sub 0.47}As epilayer on InP by two-phase liquid phase epitaxy is investigated. To saturate the In melt before growth, an overweight GaAs wafer is chosen as solid source and put on top of the melt. By adjusting the weight of In, epilayers with a lattice mismatch {Delta}a{sub {perpendicular}}/a below 2 x 10{sup -4} are obtained. It is found that the quantity of InAs source required is more than that used in single-phase growth and the growth rate is smaller in two-phase growth. The result is explained using the phase diagram and the theoretical calculation. The growth rate, lattice-mismatch data, and photoluminescence spectra of the epilayers are also presented. 14 refs., 9 figs., 1 tab.
Sponsoring Organization:
USDOE
OSTI ID:
161686
Report Number(s):
CONF-930115--
Journal Information:
Journal of Vacuum Science and Technology. B, Microelectronics Processing and Phenomena, Journal Name: Journal of Vacuum Science and Technology. B, Microelectronics Processing and Phenomena Journal Issue: 4 Vol. 11; ISSN 0734-211X; ISSN JVTBD9
Country of Publication:
United States
Language:
English