Guide to Making XPS Measurements on Nanoparticles

Journal Article · Fri May 01 04:00:00 UTC 2020 · Journal of Vacuum Science and Technology A--Vacuum, Surfaces and Films

DOI:https://doi.org/10.1116/1.5141419· OSTI ID:1606316

Baer, Donald R. ^[1]

---

1. EMERITUS PROGRAM

This guide briefly summarizes issues and considerations important for the use of X-ray Photoelectron Spectroscopy (XPS) for characterizing nanoparticles, which are important in many areas of science and technology. Because the surfaces play a major role in determining nanoparticle behaviors, XPS is an increasingly useful tool for understanding their properties, including addressing variations and non-reproducibility issues associated with these materials. The unusual physical and chemical behaviors of these particles must be considered in preparing and characterizing these materials. This guide is one of a series intended to highlight best practices in the use of XPS.

• Research Organization: Pacific Northwest National Laboratory (PNNL), Richland, WA (United States)
• Sponsoring Organization: USDOE
• DOE Contract Number: AC05-76RL01830
• OSTI ID: 1606316
• Report Number(s): PNNL-SA-149921
• Journal Information: Journal of Vacuum Science and Technology A--Vacuum, Surfaces and Films, Journal Name: Journal of Vacuum Science and Technology A--Vacuum, Surfaces and Films Journal Issue: 3 Vol. 38
• Country of Publication: United States
• Language: English