Bi-metal foil for a beam intensity/position monitor, method for determining mass absorption coefficients
The invention provides a beam intensity/positioning monitor substrate comprising a first metal foil in physical contact with a second metal foil. Also provided is a method for determining mass absorption coefficients, the method comprising measuring the absorption of an incident radiation beam by a first metal and a second metal comprising a bi-metal foil as a function of a first energy and a second energy; calculating the relative first metal thickness; using the relative thickness as a target value for the first metal fitting procedure; repeat the above steps on a free standing first metal foil; using the free standing first metal absorption measurements, bulk first metal density and first (bimetal) fit coefficients to determine first metal foil thickness; using free standing first metal to conduct a high resolution scan from just below its absorption edge to 1 keV or higher in energy; and using the free standing first metal absorption measurements below the absorption edge and experimentally determined thickness to compute mass absorption coefficients below its absorption edge.
- Research Organization:
- Argonne National Laboratory (ANL), Argonne, IL (United States)
- Sponsoring Organization:
- USDOE
- DOE Contract Number:
- AC02-06CH11357
- Assignee:
- UChicago Argonne, LLC (Chicago, IL)
- Patent Number(s):
- 10,497,593
- Application Number:
- 15/680,954
- OSTI ID:
- 1600363
- Resource Relation:
- Patent File Date: 08/18/2017
- Country of Publication:
- United States
- Language:
- English
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