Approximating the near-edge mass absorption coefficients for Ni using an ultra-thin bimetal foil

Alkire, Randall W.

doi:10.1107/S1600576716017544

Title: Approximating the near-edge mass absorption coefficients for Ni using an ultra-thin bimetal foil

Journal Article · Tue Nov 01 00:00:00 EDT 2016 · Journal of Applied Crystallography (Online)

DOI:https://doi.org/10.1107/S1600576716017544· OSTI ID:1339625

Alkire, Randall W. ^[1]

Argonne National Lab. (ANL), Argonne, IL (United States)

In an effort to improve the characteristics of a fluorescing metal-foil-based beam position monitor, a new bimetal ultra-thin (0.98/0.67 µm) Ti–Ni foil was introduced to replace an existing single-element ultra-thin 0.5 µm thick Cr foil. During characterization it was determined that absorption measurements on the bimetal foil could be used to fit the Ni mass absorption coefficients accurately in the vicinity of the NiKedge. Comparison with experimental results from the literature demonstrated that the fitting procedure produced coefficients with uncertainties of the order of ±1%. Once determined, these fit coefficients allowed the thickness of an independently mounted 8 µm thick Ni foil to be computed from absorption measurements instead of relying on a tool-based measurement of the foil thickness. Using the 8 µm thick foil, a continuous map of Ni mass absorption coefficients was produced at 1 eV resolution throughout the near-edge region. Lastly, this high-resolution map marks a significant improvement over the existing NIST XCOM or FFAST database mass absorption coefficients, which have estimated errors of 10–20% for the near-edge region.

View Accepted Manuscript (DOE)

Cite

Export

Save

Research Organization:: Argonne National Lab. (ANL), Argonne, IL (United States)

Sponsoring Organization:: USDOE Office of Science (SC), Biological and Environmental Research (BER)

Grant/Contract Number:: AC02-06CH11357

OSTI ID:: 1339625

Journal Information:: Journal of Applied Crystallography (Online), Vol. 50, Issue 1; ISSN 1600-5767

Publisher:: International Union of CrystallographyCopyright Statement

Country of Publication:: United States

Language:: English

Citation Metrics:

Cited by: 1 work

Citation information provided by
Web of Science

References (18)

New consistency tests for high-accuracy measurements of X-ray mass attenuation coefficients by the X-ray extended-range technique Chantler, C. T.; Islam, M. T.; Rae, N. A. Acta Crystallographica Section A Foundations of Crystallography, Vol. 68, Issue 2 https://doi.org/10.1107/S0108767311044990	journal	January 2012
Estimates of X-ray attenuation coefficients for the elements and their compounds Deslattes, R. D. Acta Crystallographica Section A: Crystal Physics, Diffraction, Theoretical and General Crystallography, Vol. 25, Issue 1 https://doi.org/10.1107/S0567739469000118	journal	January 1969
Development and applications of accurate measurement of X-ray absorption: The X-ray extended range technique for high accuracy absolute XAFS by transmission and fluorescence Chantler, C. T. The European Physical Journal Special Topics, Vol. 169, Issue 1 https://doi.org/10.1140/epjst/e2009-00985-8	journal	March 2009
Rocking curve measurements revisited Masiello, Fabio; Cembali, Gianfranco; Chumakov, Alexander I. Journal of Applied Crystallography, Vol. 47, Issue 4 https://doi.org/10.1107/S1600576714012527	journal	July 2014
Measurement of the x-ray mass attenuation coefficient of copper using 8.85–20 keV synchrotron radiation Chantler, C. T.; Tran, C. Q.; Barnea, Z. Physical Review A, Vol. 64, Issue 6 https://doi.org/10.1103/PhysRevA.64.062506	journal	November 2001
Fine Structure in the X-Ray Absorption Spectra of the $K$ Series of the Elements Calcium to Gallium Kievit, Ben; Lindsay, George A. Physical Review, Vol. 36, Issue 4 https://doi.org/10.1103/PhysRev.36.648	journal	August 1930
Measurement of energy resolution and dead layer thickness of LN2-cooled PIN photodiodes Weinheimer, Ch.; Schrader, M.; Bonn, J. Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, Vol. 311, Issue 1-2 https://doi.org/10.1016/0168-9002(92)90872-2	journal	January 1992
Development of a real-time timing-shutter performance monitor for protein crystallography Alkire, R. W.; Molitsky, Michael; Rotella, F. J. Journal of Synchrotron Radiation, Vol. 13, Issue 5 https://doi.org/10.1107/S0909049506027610	journal	August 2006
Mass attenuation coefficients of the elements Ti, V, Fe, Co, Ni, Cu and Zn for the K emission lines between 4.51 and 10.98 keV Unonius, L.; Suortti, P. Journal of Applied Crystallography, Vol. 22, Issue 1 https://doi.org/10.1107/S0021889888010817	journal	February 1989
Measurement of the mass attenuation coefficient for elemental materials in the range 6⩽Z⩽82 using X-rays from 13 up to 50 kev Angelone, M.; Bubba, T.; Esposito, A. Applied Radiation and Isotopes, Vol. 55, Issue 4 https://doi.org/10.1016/S0969-8043(01)00100-2	journal	October 2001
Silicon photodiode detector for small-angle X-ray scattering Jemian, P. R.; Long, G. G. Journal of Applied Crystallography, Vol. 23, Issue 5 https://doi.org/10.1107/S0021889890005167	journal	October 1990
Measurement of the x-ray mass attenuation coefficients of gold in the $38 - 50$ -keV energy range Islam, M. T.; Rae, N. A.; Glover, J. L. Physical Review A, Vol. 81, Issue 2 https://doi.org/10.1103/PhysRevA.81.022903	journal	February 2010
Design of a vacuum-compatible high-precision monochromatic beam-position monitor for use with synchrotron radiation from 5 to 25 keV Alkire, R. W.; Rosenbaum, G.; Evans, G. Journal of Synchrotron Radiation, Vol. 7, Issue 2 https://doi.org/10.1107/S090904959901568X	journal	March 2000
Problems associated with the measurement of X-ray attenuation coefficients. I. Silicon. Report of the International Union of Crystallography X-ray Attenuation Project Creagh, D. C.; Hubbell, J. H. Acta Crystallographica Section A Foundations of Crystallography, Vol. 43, Issue 1 https://doi.org/10.1107/S0108767387099793	journal	January 1987
Accurate determination of the thickness or mass per unit area of thin foils and single-crystal wafers for x-ray attenuation measurements Tran, C. Q.; Chantler, C. T.; Barnea, Z. Review of Scientific Instruments, Vol. 75, Issue 9 https://doi.org/10.1063/1.1781383	journal	September 2004
X-ray resonant Raman cross section and yield in nickel Manninen, S.; Suortti, P.; Cooper, M. J. Physical Review B, Vol. 34, Issue 12 https://doi.org/10.1103/PhysRevB.34.8351	journal	December 1986
Mass attenuation coefficients in the range , K fluorescence yield and relative X-ray emission rate for Ti, V, Fe, Co, Ni, Cu and Zn measured with a tunable monochromatic X-ray source Ménesguen, Y.; Lépy, M. -C. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, Vol. 268, Issue 16 https://doi.org/10.1016/j.nimb.2010.05.044	journal	August 2010
Measurement of X-ray mass attenuation coefficient of nickel around the K-edge using synchrotron radiation based X-ray absorption study Roy, Bunty Rani; Rajput, Parasmani; Jha, S. N. Radiation Physics and Chemistry, Vol. 114 https://doi.org/10.1016/j.radphyschem.2015.05.032	journal	September 2015

Cited By (1)

Study of mechanical, electronic and optical properties of PbZrO ₃ and PbHfO ₃ ; DFT approach Rashid, Muhammad; Mahmood, Q.; Babar, Faizan Materials Research Express, Vol. 6, Issue 6 https://doi.org/10.1088/2053-1591/ab0f05	journal	March 2019

Similar Records

Bi-metal foil for a beam intensity/position monitor, method for determining mass absorption coefficients

Patent · Tue Dec 03 00:00:00 EST 2019 · OSTI ID:1339625

Alkire, Randy

Development and operation of a thin foil Faraday collector as a lost ion diagnostic for high yield d-t tokamak fusion plasmas

Journal Article · Fri Jan 01 00:00:00 EST 1999 · Review of Scientific Instruments · OSTI ID:1339625

Cecil, F E; Roy, B; Kern, S; +11 more

Recovery Act : Near-Single-Crystalline Photovoltaic Thin Films on Polycrystalline, Flexible Substrates

Technical Report · Mon Nov 29 00:00:00 EST 2010 · OSTI ID:1339625

Selvamanickam, Venkat; Freundlich, Alex

Related Subjects

36 MATERIALS SCIENCE
mass absorption coefficients
nickel
titanium
absorption
ultra-thin foils
Ni K edge

Title: Approximating the near-edge mass absorption coefficients for Ni using an ultra-thin bimetal foil

Citation Formats

References (18)

Cited By (1)

Similar Records

Related Subjects