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Title: Bi-metal foil for a beam intensity/position monitor, method for determining mass absorption coefficients

Abstract

The invention provides a beam intensity/positioning monitor substrate comprising a first metal foil in physical contact with a second metal foil. Also provided is a method for determining mass absorption coefficients, the method comprising measuring the absorption of an incident radiation beam by a first metal and a second metal comprising a bi-metal foil as a function of a first energy and a second energy; calculating the relative first metal thickness; using the relative thickness as a target value for the first metal fitting procedure; repeat the above steps on a free standing first metal foil; using the free standing first metal absorption measurements, bulk first metal density and first (bimetal) fit coefficients to determine first metal foil thickness; using free standing first metal to conduct a high resolution scan from just below its absorption edge to 1 keV or higher in energy; and using the free standing first metal absorption measurements below the absorption edge and experimentally determined thickness to compute mass absorption coefficients below its absorption edge.

Inventors:
Publication Date:
Research Org.:
Argonne National Lab. (ANL), Argonne, IL (United States)
Sponsoring Org.:
USDOE
OSTI Identifier:
1600363
Patent Number(s):
10,497,593
Application Number:
15/680,954
Assignee:
UChicago Argonne, LLC (Chicago, IL)
DOE Contract Number:  
AC02-06CH11357
Resource Type:
Patent
Resource Relation:
Patent File Date: 08/18/2017
Country of Publication:
United States
Language:
English
Subject:
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; 71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS

Citation Formats

Alkire, Randy. Bi-metal foil for a beam intensity/position monitor, method for determining mass absorption coefficients. United States: N. p., 2019. Web.
Alkire, Randy. Bi-metal foil for a beam intensity/position monitor, method for determining mass absorption coefficients. United States.
Alkire, Randy. Tue . "Bi-metal foil for a beam intensity/position monitor, method for determining mass absorption coefficients". United States. https://www.osti.gov/servlets/purl/1600363.
@article{osti_1600363,
title = {Bi-metal foil for a beam intensity/position monitor, method for determining mass absorption coefficients},
author = {Alkire, Randy},
abstractNote = {The invention provides a beam intensity/positioning monitor substrate comprising a first metal foil in physical contact with a second metal foil. Also provided is a method for determining mass absorption coefficients, the method comprising measuring the absorption of an incident radiation beam by a first metal and a second metal comprising a bi-metal foil as a function of a first energy and a second energy; calculating the relative first metal thickness; using the relative thickness as a target value for the first metal fitting procedure; repeat the above steps on a free standing first metal foil; using the free standing first metal absorption measurements, bulk first metal density and first (bimetal) fit coefficients to determine first metal foil thickness; using free standing first metal to conduct a high resolution scan from just below its absorption edge to 1 keV or higher in energy; and using the free standing first metal absorption measurements below the absorption edge and experimentally determined thickness to compute mass absorption coefficients below its absorption edge.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2019},
month = {12}
}

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Works referenced in this record:

Dual beam X-ray thickness gauge
patent, July 1977


Slim frame backlight module
patent, September 2015


Robot-based automation system for cryogenic crystal sample mounting
patent, January 2007


Beam position monitor
patent, July 2003