The 4D Camera: Very High Speed Electron Counting for 4D-STEM

Ciston, Jim; Johnson, Ian J.; Draney, Brent R.; Ercius, Peter; Fong, Erin; Goldschmidt, Azriel; Joseph, John M.; Lee, Jason R.; Mueller, Alexander; Ophus, Colin; Selvarajan, Ashwin; Skinner, David E.; Stezelberger, Thorsten; Tindall, Craig S.; Minor, Andrew M.; Denes, Peter

doi:10.1017/s1431927619010389

The 4D Camera: Very High Speed Electron Counting for 4D-STEM

Journal Article · Mon Aug 05 00:00:00 EDT 2019 · Microscopy and Microanalysis

DOI:https://doi.org/10.1017/s1431927619010389· OSTI ID:1599804

Ciston, Jim ^[1]; Johnson, Ian J. ^[1]; Draney, Brent R. ^[1]; Ercius, Peter ^[1]; Fong, Erin ^[1]; Goldschmidt, Azriel ^[1]; Joseph, John M. ^[1]; Lee, Jason R. ^[1]; Mueller, Alexander ^[1]; Ophus, Colin ^[1]; Selvarajan, Ashwin ^[1]; Skinner, David E. ^[1]; Stezelberger, Thorsten ^[1]; Tindall, Craig S. ^[1]; Minor, Andrew M. ^[2]; Denes, Peter ^[1]

Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States)
Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States); Univ. of California, Berkeley, CA (United States)

A vast array of new experimental modalities have been enabled in the past several years through the development of pixelated detectors synchronized to probe scanning electronics. Such camera systems can then acquire the rich information present in the central portion of the convergent beam electron diffraction pattern as a function of probe position (4D-STEM). Here, we present the development, installation, and characterization of the 4D Camera, a CMOS Active Pixel Sensor that consists of a 576 x 576 array of 10 μm pixels of a design related to the original TEAM detector and an outer HAADF detector with 16 concentric quadrant diodes.

Research Organization:: Lawrence Berkeley National Laboratory (LBNL), Berkeley, CA (United States)

Sponsoring Organization:: USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22)

Grant/Contract Number:: AC02-05CH11231

OSTI ID:: 1599804

Journal Information:: Microscopy and Microanalysis, Journal Name: Microscopy and Microanalysis Journal Issue: S2 Vol. 25; ISSN 1431-9276

Publisher:: Microscopy Society of America (MSA)Copyright Statement

Country of Publication:: United States

Language:: English

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