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Title: Inferred UV fluence focal-spot profiles from soft x-ray pinhole-camera measurements on OMEGA

Journal Article · · Review of Scientific Instruments
DOI:https://doi.org/10.1063/1.5120708· OSTI ID:1598519

A method was developed with laser-irradiated Au planar foils to characterize the focal spot of UV laser beams on target at full energy from soft x-ray emission. A pinhole camera with a back-thinned charge-coupled–device detector and filtration with thin Be and Al foil filters provides images of the x-ray emission at photon energies <2 keV. This method requires a careful measurement of the relation between the applied UV fluence and the x-ray signal, which can be described by a power-law dependence. The measured exponent γ ~ 2 provides a dynamic range of ~25 for the inferred UV fluence. UV fluence profiles of selected beams were measured for 100-ps and 1-ns laser pulses and were compared to directly measured profiles from an UV equivalent-target-plane diagnostic. The inferred spot size and super-Gaussian order from the x-ray technique agree within several percent with the values measured with the direct UV measurements.

Research Organization:
Univ. of Rochester, NY (United States)
Sponsoring Organization:
USDOE National Nuclear Security Administration (NNSA)
Grant/Contract Number:
NA0003856
OSTI ID:
1598519
Alternate ID(s):
OSTI ID: 1597538
Report Number(s):
2019-242; 1548; 2505; 2019-242, 1548, 2505; TRN: US2103300
Journal Information:
Review of Scientific Instruments, Vol. 91, Issue 2; ISSN 0034-6748
Publisher:
American Institute of Physics (AIP)Copyright Statement
Country of Publication:
United States
Language:
English
Citation Metrics:
Cited by: 3 works
Citation information provided by
Web of Science

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