Imaging crystal stress in diamond using ensembles of nitrogen-vacancy centers
Journal Article
·
· Physical Review. B
- Harvard Univ., Cambridge, MA (United States); Harvard-Smithsonian Center for Astrophysics, Cambridge, MA (United States); Sandia National Lab. (SNL-NM), Albuquerque, NM (United States); University of Maryland
- Harvard Univ., Cambridge, MA (United States)
- Harvard Univ., Cambridge, MA (United States); Massachusetts Inst. of Technology (MIT), Cambridge, MA (United States)
- Univ. of Chicago, IL (United States)
- Harvard Univ., Cambridge, MA (United States); Harvard-Smithsonian Center for Astrophysics, Cambridge, MA (United States)
We present a micrometer-resolution and millimeter-field-of-view stress imaging method for diamonds containing a thin surface layer of nitrogen vacancy (NV) color centers. In this method, we reconstruct stress tensor elements over a two-dimensional field of view from NV optically-detected magnetic resonance (ODMR) spectra. We use this technique to study how stress inhomogeneity affects NV magnetometry performance, and show how NV stress imaging is a useful and direct way to assess these effects. This new tool for mapping stress in diamond will aid optimization of NV-diamond sensing, with wide-ranging applications in the physical and life sciences.
- Research Organization:
- Smithsonian Astrophysical Observatory, Cambridge, MA (United States); Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)
- Sponsoring Organization:
- USDOE Office of Science (SC); Fannie and John Hertz Foundation Graduate Fellowship; DARPA; DRINQS; Air Force Office of Scientific Research Award; National Science Foundation (NSF); USDOE National Nuclear Security Administration (NNSA)
- Grant/Contract Number:
- SC0019396; AC04-94AL85000
- OSTI ID:
- 1594039
- Alternate ID(s):
- OSTI ID: 1769915
- Journal Information:
- Physical Review. B, Journal Name: Physical Review. B Journal Issue: 17 Vol. 100; ISSN 2469-9950; ISSN PRBMDO
- Publisher:
- American Physical Society (APS)Copyright Statement
- Country of Publication:
- United States
- Language:
- English
Characterization of microscopic ferromagnetic defects in thin films using magnetic microscope based on Nitrogen-Vacancy centres
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journal | July 2021 |
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