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Effects of Electron Beam Induced Current on Breakdown Voltage of GaN P-N Junction Diodes and AlGaN/GaN Schottky Diodes.

Conference ·
OSTI ID:1582211
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Abstract not provided.
Research Organization:
Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)
Sponsoring Organization:
USDOE National Nuclear Security Administration (NNSA)
DOE Contract Number:
AC04-94AL85000
OSTI ID:
1582211
Report Number(s):
SAND2018-9139C; 667239
Country of Publication:
United States
Language:
English

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