Comparison of Sensitive Volumes Associated with Ion-and Laser-Induced Charge Collection in an Epitaxial Silicon Diode

Journal Article · Tue Sep 24 00:00:00 EDT 2019 · IEEE Transactions on Nuclear Science

DOI:https://doi.org/10.1109/TNS.2019.2943472· OSTI ID:1581984

Ryder, Kaitlyn L. ^[1]; Ryder, Landen D. ^[1]; Sternberg, Andrew L. ^[1]; Kozub, John A. ^[1]; Zhang, En Xia ^[1]; Khachatrian, Ani ^[2]; Buchner, Steven P. ^[2]; McMorrow, Dale P. ^[2]; Hales, Joel M. ^[3]; Zhao, Yuanfu ^[4]; Wang, Liang ^[4]; Wang, Chuanmin ^[4]; Weller, Robert A. ^[1]; Schrimpf, Ronald D. ^[1]; Weiss, Sharon M. ^[1]; Reed, Robert A. ^[1]

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1. Vanderbilt Univ., Nashville, TN (United States)
2. U.S. Naval Research Lab., Washington, D.C. (United States)
3. KeyW Corp., Herndon, VA (United States)
4. Beijing Microelectronics Technology Inst., Beijing (China)

A sensitive volume is developed using pulsed laser-induced collected charge for two bias conditions in an epitaxial silicon diode. These sensitive volumes show good agreement with experimental two photon absorption laser-induced collected charge at a variety of focal positions and pulse energies. When compared to ion-induced collected charge, the laser-based sensitive volume over predicts the experimental collected charge at low bias and agrees at high bias. Here, a sensitive volume based on ion-induced collected charge adequately describes the ion experimental results at both biases. Differences in the amount of potential modulation explain the differences between the ion-and laser-based sensitive volumes at the lower bias. Truncation of potential modulation by the highly doped substrate at the higher bias results in similar sensitive volumes.

• Research Organization: Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)
• Sponsoring Organization: USDOE National Nuclear Security Administration (NNSA)
• Grant/Contract Number: AC04-94AL85000; NA0003525
• OSTI ID: 1581984
• Report Number(s): SAND--2019-7444J; 676954
• Journal Information: IEEE Transactions on Nuclear Science, Journal Name: IEEE Transactions on Nuclear Science Journal Issue: 1 Vol. 67; ISSN 0018-9499
• Publisher: IEEE
• Country of Publication: United States
• Language: English

Related Subjects

73 NUCLEAR PHYSICS AND RADIATION PHYSICS
Pulsed laser
sensitive volume
single-event effects
single-event transients
two-photon absorption