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U.S. Department of Energy
Office of Scientific and Technical Information

Process Modeling of LENS Manufacturing; Effects of Laser Scan Path on Residual Stress.

Conference ·
OSTI ID:1573549

Abstract not provided.

Research Organization:
Sandia National Laboratories (SNL-CA), Livermore, CA (United States); Sandia National Laboratories, Albuquerque, NM
Sponsoring Organization:
USDOE National Nuclear Security Administration (NNSA)
DOE Contract Number:
AC04-94AL85000
OSTI ID:
1573549
Report Number(s):
SAND2018-8256C; 666443
Country of Publication:
United States
Language:
English

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