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Title: High sensitivity hexagonal boron nitride lateral neutron detectors

Journal Article · · Applied Physics Letters
DOI:https://doi.org/10.1063/1.5098331· OSTI ID:1571783

Hexagonal boron nitride (h-BN) thermal neutron detectors have demonstrated the highest detection efficiency among all solid-state detectors (at 58% for a detection area of 1 mm2 and 53% for a detection area of 9 mm2). However, scaling up the detector size of vertical h-BN detectors is challenging due to increased dark current, capacitance, and surface recombination with the increasing detection area. Here, we report the demonstration of a 29 mm2 thermal neutron detector fabricated from a freestanding 10B enriched h-BN epilayer of 90 μm in thickness with a detection efficiency of 50% by employing a lateral device geometry. The lateral detector geometry takes advantage of the unique layered structure of h-BN which naturally provides higher in-plane carrier mobilities than those in the vertical direction. Moreover, due to the reduced area of metals in contact with the h-BN material, the detrimental effects associated with the surface recombination at the metal contacts and device capacitance were reduced, which resulted in improved charge collection efficiency and signal to noise ratios. Furthermore, this work laid the ground work for scaling up to large size neutron detectors based on h-BN.

Research Organization:
Texas Tech Univ., Lubbock, TX (United States)
Sponsoring Organization:
USDOE Advanced Research Projects Agency - Energy (ARPA-E)
Grant/Contract Number:
AR0000964; NA0002927
OSTI ID:
1571783
Alternate ID(s):
OSTI ID: 1524460
Journal Information:
Applied Physics Letters, Vol. 114, Issue 22; ISSN 0003-6951
Publisher:
American Institute of Physics (AIP)Copyright Statement
Country of Publication:
United States
Language:
English
Citation Metrics:
Cited by: 14 works
Citation information provided by
Web of Science

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Cited By (2)

Lateral charge carrier transport properties of B-10 enriched hexagonal BN thick epilayers journal August 2019
Anisotropic index of refraction and structural properties of hexagonal boron nitride epilayers probed by spectroscopic ellipsometry journal February 2020

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