Failure Thresholds in CBRAM Due to Total Ionizing Dose and Displacement Damage Effects.

Conference · Sun Jul 01 00:00:00 EDT 2018

DOI:https://doi.org/10.1109/TNS.2018.2882529· OSTI ID:1570179

Taggart, Jennifer Lynn; Jacobs-Gedrim, Robin B; McLain, Michael Lee; Barnaby, Hugh; Bielejec, Edward S.; Hardy, W; Marinella, Matthew; Kozicki, M. N.; Holbert, K.

Abstract not provided.

• Research Organization: Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)
• Sponsoring Organization: USDOE National Nuclear Security Administration (NNSA)
• DOE Contract Number: AC04-94AL85000
• OSTI ID: 1570179
• Report Number(s): SAND2018-7487C; 665746
• Country of Publication: United States
• Language: English