Novel Applications of Scanning Ultrafast Electron Microscopy (SUEM)
- Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
The Scanning Ultrafast Electron Microscope (SUEM) was used to image a wide array samples using a variety of standard and non-standard operating conditions on a custom system built in Org. 8942. The ability of this technique to produce high-quality images was assessed during this one year LDRD. To obtain details about the devices imaged, as well as the experimental details, please refer to the classified report from the project manager, Rich Dondero, or the NSP IA lead, Kristina Czuchlewski.
- Research Organization:
- Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States); Sandia National Laboratories, Livermore, CA
- Sponsoring Organization:
- USDOE National Nuclear Security Administration (NNSA); USDOE Laboratory Directed Research and Development (LDRD) Program
- DOE Contract Number:
- AC04-94AL85000; NA0003525
- OSTI ID:
- 1564040
- Report Number(s):
- SAND--2019-10952; 679441
- Country of Publication:
- United States
- Language:
- English
Similar Records
Novel Applications of Near-Field Scanning Optical Microscopy (NSOM)
Localized Electromagnetic Probing for Failure Analysis in Noisy Environments
Novel Applications of the Multi-Beam SEM [Abstract Only]
Technical Report
·
Sat Sep 01 00:00:00 EDT 2018
·
OSTI ID:1475250
Localized Electromagnetic Probing for Failure Analysis in Noisy Environments
Technical Report
·
Sun Sep 01 00:00:00 EDT 2019
·
OSTI ID:1569344
Novel Applications of the Multi-Beam SEM [Abstract Only]
Technical Report
·
Thu Sep 01 00:00:00 EDT 2016
·
OSTI ID:1562396