Effective ionic radii in oxides and fluorides
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May 1969 |
Electro-Thermal Model of Threshold Switching in TaO x -Based Devices
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March 2017 |
Anatomy of a Nanoscale Conduction Channel Reveals the Mechanism of a High-Performance Memristor
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November 2011 |
Spectromicroscopy of tantalum oxide memristors
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June 2011 |
Electrical transport and thermometry of electroformed titanium dioxide memristive switches
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December 2009 |
Thermochemical resistive switching: materials, mechanisms, and scaling projections
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July 2011 |
Erratum to: The O-Ta (Oxygen-Tantalum) system
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August 1997 |
Heat transport in thin dielectric films
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March 1997 |
Imaging the Three-Dimensional Conductive Channel in Filamentary-Based Oxide Resistive Switching Memory
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November 2015 |
Z-contrast stem for materials science
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June 1989 |
Experimental quantification of annular dark-field images in scanning transmission electron microscopy
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November 2008 |
Atomic Radii and Interatomic Distances in Metals
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March 1947 |
Comprehensive Physical Model of Dynamic Resistive Switching in an Oxide Memristor
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February 2014 |
Conduction Channel Formation and Dissolution Due to Oxygen Thermophoresis/Diffusion in Hafnium Oxide Memristors
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November 2016 |
Impact of oxygen exchange reaction at the ohmic interface in Ta 2 O 5 -based ReRAM devices
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January 2016 |
Probing nanoscale oxygen ion motion in memristive systems
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May 2017 |
Coexistence of Filamentary and Homogeneous Resistive Switching in Fe-Doped SrTiO3 Thin-Film Memristive Devices
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August 2010 |
Direct Identification of the Conducting Channels in a Functioning Memristive Device
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June 2010 |
Transient Thermometry and High-Resolution Transmission Electron Microscopy Analysis of Filamentary Resistive Switches
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July 2016 |
The mechanism of electroforming of metal oxide memristive switches
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May 2009 |
Separation of current density and electric field domains caused by nonlinear electronic instabilities
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May 2018 |
Nanoscale cation motion in TaOx, HfOx and TiOx memristive systems
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September 2015 |
Analytical Modeling of Oxide-Based Bipolar Resistive Memories and Complementary Resistive Switches
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July 2014 |
Avalanche-Discharge-Induced Electrical Forming in Tantalum Oxide-Based Metal-Insulator-Metal Structures
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October 2015 |
Effect of thermal insulation on the electrical characteristics of NbO x threshold switches
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February 2018 |
Nanoionic Resistive Switching Memories: On the Physical Nature of the Dynamic Reset Process
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November 2015 |
Memristive devices for computing
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January 2013 |
Physical electro-thermal model of resistive switching in bi-layered resistance-change memory
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April 2013 |
Effect of voltage polarity and amplitude on electroforming of TiO2 based memristive devices
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January 2013 |
Multiple Memory States in Resistive Switching Devices Through Controlled Size and Orientation of the Conductive Filament
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January 2013 |
Direct Observations of Nanofilament Evolution in Switching Processes in HfO 2 -Based Resistive Random Access Memory by In Situ TEM Studies
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January 2017 |
Electron energy-loss spectroscopy in the TEM
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December 2008 |
Complementary Switching in Oxide-Based Bipolar Resistive-Switching Random Memory
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January 2013 |
Physical origins of current and temperature controlled negative differential resistances in NbO2
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September 2017 |
Subfilamentary Networks Cause Cycle-to-Cycle Variability in Memristive Devices
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July 2017 |
Three-Dimensional Observation of the Conductive Filament in Nanoscaled Resistive Memory Devices
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April 2014 |
Direct Observation of Localized Radial Oxygen Migration in Functioning Tantalum Oxide Memristors
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February 2016 |
Controlling Conductive Filament and Tributyrin Sensing Using an Optimized Porous Iridium Interfacial Layer in Cu/Ir/TiN x O y /TiN
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December 2018 |
Redox-Based Resistive Switching Memories - Nanoionic Mechanisms, Prospects, and Challenges
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July 2009 |
Modeling the Universal Set/Reset Characteristics of Bipolar RRAM by Field- and Temperature-Driven Filament Growth
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December 2011 |
Resistive Switching by Voltage-Driven Ion Migration in Bipolar RRAM—Part II: Modeling
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September 2012 |
A Physics-Based Compact Model of Metal-Oxide-Based RRAM DC and AC Operations
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December 2013 |
Characteristic electroforming behavior in Pt/TiO2/Pt resistive switching cells depending on atmosphere
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December 2008 |
Physical modeling of the electroforming process in resistive-switching devices
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conference
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September 2017 |
Impact of Joule heating on the microstructure of nanoscale TiO 2 resistive switching devices
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April 2013 |
Oxygen Vacancy Creation, Drift, and Aggregation in TiO 2 -Based Resistive Switches at Low Temperature and Voltage
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March 2015 |
Thermophoresis/diffusion as a plausible mechanism for unipolar resistive switching in metal–oxide–metal memristors
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March 2012 |
Reduction in the reset current in a resistive random access memory consisting of NiOx brought about by reducing a parasitic capacitance
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July 2008 |
Pulse-Programming Instabilities of Unipolar-Type NiOx
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June 2010 |
Atomic structure of conducting nanofilaments in TiO2 resistive switching memory
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January 2010 |
Direct Evidence of the Overshoot Suppression in Ta<sub>2</sub>O<sub>5</sub>-Based Resistive Switching Memory With an Integrated Access Resistor
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October 2015 |
Sub-10 nm Ta Channel Responsible for Superior Performance of a HfO2 Memristor
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June 2016 |
Formation of the Conducting Filament in TaO x -Resistive Switching Devices by Thermal-Gradient-Induced Cation Accumulation
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June 2018 |
Impact of oxygen exchange reaction at the ohmic interface in Ta2O5-based ReRAM devices.
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text
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January 2016 |
Direct Observation of Localized Radial Oxygen Migration in Functioning Tantalum Oxide Memristors
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January 2016 |