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Solid-state framing camera operating in interferometric mode

Journal Article · · Review of Scientific Instruments
DOI:https://doi.org/10.1063/1.5038108· OSTI ID:1545487
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  1. Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States)
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A high speed solid-state framing camera has been created which can operate in interferometric mode. This camera measures the change in the index of refraction of a semiconductor when x-rays are incident upon it. This instrument uses an x-ray transmission grating/mask in front of the semiconductor to induce a corresponding phase grating in the semiconductor which can then be measured by an infrared probe beam. The probe beam scatters off of this grating, enabling a measure of the x-ray signal incident on the semiconductor. In this specific instrument, the zero-order reflected probe beam is attenuated and interfered with the diffracted orders to produce an interferometric image on a charge coupled device camera of the phase change induced inside the semiconductor by the incident x-rays.
Research Organization:
Lawrence Livermore National Laboratory (LLNL), Livermore, CA (United States)
Sponsoring Organization:
USDOE National Nuclear Security Administration (NNSA); USDOE Office of Science (SC)
Grant/Contract Number:
AC52-07NA27344
OSTI ID:
1545487
Journal Information:
Review of Scientific Instruments, Journal Name: Review of Scientific Instruments Journal Issue: 10 Vol. 89; ISSN 0034-6748
Publisher:
American Institute of Physics (AIP)Copyright Statement
Country of Publication:
United States
Language:
English

References (9)

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Active optics methods for exoplanet direct imaging: Stress polishing of supersmooth aspherics for VLT-SPHERE planet finder journal February 2012
Diagnostics hardening for harsh environment in Laser Mégajoule (invited) journal October 2008
Ultrafast semiconductor x-ray detector journal July 2012
Solid-state framing camera with multiple time frames journal October 2013
Circularly Symmetric Apodization via Star‐shaped Masks journal December 2003
Power spectral density analysis of optical substrates for gravitational-wave interferometry journal January 1999
Photoexcited-carrier-induced refractive index change in small bandgap semiconductors journal January 2006
Spectral encoding of x-ray/optical relative delay journal January 2011

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Related Subjects

74 ATOMIC AND MOLECULAR PHYSICS