Adhesion Degradation of the Metallization-Encapsulant Interface

Conference · Fri Sep 29 00:00:00 EDT 2017

DOI:https://doi.org/10.4229/EUPVSEC20172017-5BO.5.3· OSTI ID:1544989

Bosco, Nicholas S ^[1]; Hacke, Peter L ^[1]; Kurtz, Sarah ^[1]; Tracy, Jared ^[2]; Dauskardt, Reinhold H. ^[2]

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1. National Renewable Energy Laboratory (NREL), Golden, CO (United States)
2. Stanford University

Adhesion of the silver metallization/ encapsulant interface was measured through temperature, humidity and voltage bias stress. Results indicate that adhesion at this interface is severely compromised by even short exposures to humidity and quickly plateaus with further, prolonged, exposure. The magnitude of degradation is also identical to that measured through a three-month outdoor, on-sun, exposure. While the addition of a voltage bias also appears capable of further degrading adhesion below this plateau level, in the absence of humidity, adhesion may be similarly degraded.

• Research Organization: National Renewable Energy Lab. (NREL), Golden, CO (United States)
• Sponsoring Organization: USDOE Office of Energy Efficiency and Renewable Energy (EERE), Renewable Power Office. Solar Energy Technologies Office
• DOE Contract Number: AC36-08GO28308
• OSTI ID: 1544989
• Report Number(s): NREL/CP-5K00-67977
• Resource Relation: Conference: Presented at the 33rd European Photovoltaic Solar Energy Conference and Exhibition, 25-29 September 2017, Amsterdam, The Netherlands
• Country of Publication: United States
• Language: English

Related Subjects

14 SOLAR ENERGY
36 MATERIALS SCIENCE
degradation
encapsulation
reliability
screen printing
metallization